Laboratory of Electron and Atomic Force Microscopy
The laboratory is equipped with the electron microprobe JXA-733 of JEOL, Japan,
using three wavelength dispersive crystal x-ray spectrometers and Si(Li) energy dispersive spectrometer.
The microprobe enables observation in secondary electron mode with resolution up to 7 nm,
qualitative and quantitative elemental analysis with resolution of 1µm based on the x-ray emission
spectrometry and the x-ray mapping image analysis. It is used for semiconductors, alloys and high
temperature superconductors characterization, surface morphology observations and magnetic domains
observations using special back scattered electron detector.
Atomic force scanning microscope Explorer of Thermomicroscopes, USA, with up to atomic resolution, is used for surface morphology and magnetic measurements.
Department of Structure Analysis
