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Research activities of the group involve prevailingly
1) measurement of magnetotransport in semiconductor structures with lowered dimension at low temperatures
2) experimental study of bound electron states due to defects in semiconductors.
The following equipment and experimental methods are available
1) Equipment for magnetotransport measurements at low temperatures (0.3 K), Oxford Instruments superconducting magnet up to 8 Tesla, Oxford Instruments AVS-47 ultralow excitation resistance bridge.
2) Resistivity measurements in the range between 10-4 W and 1014 W , current measurements between 10-14 A and 10 A in the temperature range between 0.3 K and 400 K.
3) Frequency dependence of complex impedance in the range from 5 Hz to 13 MHz and with a sensitivity ranging from aF to mF for the imaginary part and from 10-16S to 10-4 S for the real part of the impedance, Hewlett-Packard 4192A - low frequency analyser, GR 1616 capacitance system.
4) Measurements of current-voltage curves and capacitance-voltage characteristics at temperatures between 1.2 K and 350 K and in the computer controlled modes. The equipments include a mercury probe.
5) Deep Level Transient Spectroscopy (DLTS) operating at 1MHz with the sensitivity ND/NS = 10-7 (ND and NS being the concentrations of deep and shallow impurities, respectively) over the temperature range between 4.2 K and 400 K with the possibility of using also the frequency scan. Photoinduced Current Transient Spectroscopy (PICTS) with a semiconductor laser excitation in the temperature range from 77 K to 450 K with a current resolution of the order of 1 pA and time resolution below 1 ms.
6) Unipress high pressure compressor (0 - 1.5 GPa).
The group has a considerable experience in the work with the techniques mentioned above on a good international level, having a unique possibility of combining high hydrostatic pressure with a wide range of transport methods.
