Conventional transmission electron microscope

Transmission electron microscope (TEM) Jeol 1200FX is used for conventional electron microscopy techniques (i.e. studying of lattice defects and diffraction patterns) and dynamic experiments. The system operates at maximum accelerating voltage of 120 kV and is equipped with CCD camera, software and two home-designed holders for in-situ experiments (double tilt straining holder and single tilt heating/straining holder).

Specifications:
Accelerating voltage: 40 - 120 kV
Resolution: 0.14 nm (lattice), 0.3 nm (point to point)
Electron gun: tungsten filament

Holders

• Single tilt
• Double tilt
• Rotational
• Single tilt heating/straining
• Double tilt straining holder (y=±10°, x=±30°)

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