Thesis deals with design, analysis and testing of the device for measurement of the mechanical properties (elastic and shear moduli) of the micro/nano materials and thin films utilizing non-destructive methods. The main purposes of the research are to design and to analyze the devices for non-destructive material testing for macroscopic structures and later on for micro/nano materials and based on accumulated knowledge to produce a prototype of device for measurement of thicknesses of thin films and the mechanical properties of the micro/nano structures for real application use.

Fig. 1. Light reflection and penetration through a thin film.

Fig. 2. (a) Wrinkling pattern – Image from AFM, (b) Scheme of the wrinkling pattern
 

References:

1. A. I. Fedorchenko, I. Stachiv, A.-B. Wang and W.-C. Wang, “Fundamental frequencies of mechanical systems with piecewise constant properties,” Journal of sound and vibration, 317, 490-495, 2008.
2. A. I. Fedorchenko, A.-B. Wang, V. I. Marshanov, W.-P. Huang and H.-H. Cheng, Strain induced wrinkling on SiGe free standing films, Applied Physics Letters 89, 043119-1 - 043119-3, 2006.
3. W.-P. Huang, H.-H. Cheng, A. I. Fedorchenko and A.-B. Wang, “Strain on wrinkled bilayer thin film,” Applied Physics Letters 91, 053103-1 - 053103-3, 2007.
4. A. I. Fedorchenko, A.-B. Wang and H.-H. Cheng, “Thickness dependence of nanofilm elastic modulus,” Applied Physics Letters 94, 152111-1 - 152111-3, 2009.