Electrophoretic deposition (EPD).
Scanning electron microscopy (SEM) and focused ion beam microscopy (FIB).
Electrical characterization of semiconductor materials (C–V, I–V, DLTS, Hall effect, Admittance spectroscopy). Optical characterization of semiconductor materials (Vis–UV spectroscopy, Raman spectroscopy).
Preparation and characterization of radiation detectors.
2007: Ph.D.: Czech Technical University in Prague, Faculty of Electrical Engineering, Department of Microelectronics. Specialization: Electronics.
2002: Mgr.: Yuriy Fedkovych Chernivtsi National University, Faculty of Physics, Department of Electronics and Power Engineering.
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