Publications - Electron optics

Journal Article

2015

Knápek, Alexandr; Radlička, Tomáš; Krátký, Stanislav. Simulation and Optimization of a Carbon Nanotube Electron Source. Microscopy and Microanalysis 2015, vol. 21, S4, pp. 60-65. ISSN 1431-9276. ABSTRACT

Neděla, Vilém; Konvalina, Ivo; Oral, Martin; Hudec, Jiří. Monte Carlo Simulations of Signal Electrons Collection Efficiency and Development of New Detectors for ESEM. Microscopy and Microanalysis 2015, vol. 21, S3, pp. 1109-1110. ISSN 1431-9276.

Neděla, Vilém; Konvalina, Ivo; Oral, Martin; Hudec, Jiří. The Simulation of Energy Distribution of Electrons Detected by Segmental Ionization Detector in High Pressure Conditions of ESEM. Microscopy and Microanalysis 2015, vol. 21, S4, pp. 264-269. ISSN 1431-9276. ABSTRACT

Oral, Martin; Neděla, Vilém. Dynamic Correction of Higher-Order Deflection Aberrations in the Environmental SEM. Microscopy and Microanalysis 2015, vol. 21, S4, pp. 194-199. ISSN 1431-9276. ABSTRACT

Radlička, Tomáš. Wave Optical Calculation of Probe Size in Low Energy Scanning Electron Microscope. Microscopy and Microanalysis 2015, vol. 21, S4, pp. 212-217. ISSN 1431-9276. ABSTRACT

Zelinka, Jiří; Oral, Martin; Radlička, Tomáš. Simulation of Space Charge Effects in Electron Optical System Based on the Calculations of Current Density. Microscopy and Microanalysis 2015, vol. 21, S4, pp. 246-251. ISSN 1431-9276. ABSTRACT

2014

Sháněl, O.; Zlámal, Jakub; Oral, Martin. Calculation of the performance of magnetic lenses with limited machining precision. Ultramicroscopy 2014, roč. 137, FEB 2014, s. 1-6. ISSN 0304-3991. ABSTRACT

2012

Oral, Martin; Radlička, Tomáš; Lencová, B. Effect of sample tilt on PEEM resolution. Ultramicroscopy. 2012, vol. 119, S1, pp. 45-50. ISSN 0304-3991. ABSTRACT

2011

Kroupa, M.; Jakubek, J.; Krejčí, F.; Žemlička, J.; Horáček, Miroslav; Radlička, Tomáš; Vlček, Ivan. Coincidence imaging system with electron optics. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 633, Supl. 1, S270-S273. ISSN 0168-9002. ABTRACT

Neděla, Vilém; Konvalina, Ivo; Lencová, Bohumila; Zlámal, J. Comparison of calculated, simulated and measured signal amplification in variable pressure SEM. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 645, iss. 1, pp. 79-83. ISSN 0168-9002. ABSTRACT

Neděla, Vilém; Konvalina, Ivo; Lencová, B.; Zlámal, J. Simulation of Energy Selective signal Amplification in Gas Environment of Variable Pressure SEM. Microscopy and Microanalysis. 2011, vol. 17, Suppl. 2, pp. 920-921. ISSN 1431-9276. ABSTRACT

Oral, Martin; Lencová, Bohumila. Correction of sample tilt in FIB instruments. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 645, iss. 1, pp. 130-135. ISSN 0168-9002. ABSTRACT

Radlička, Tomáš; Lencová, Bohumila. Influence of the clusters on the Bi LMIS properties. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 645, iss. 1, pp. 124-129. ISSN 0168-9002. ABSTRACT

Zlámal, J.; Lencová, Bohumila. Development of EOD for the design in electron and ion microscopy. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 654, iss. 1, pp. 278-282. ISSN 0168-9002. ABSTRACT

2010

Radlička, Tomáš; Lencová, Bohumila. Determination of analytical expansion from numerical field data. Ultramicroscopy. 2010, vol. 110, iss. 9, pp. 1198-1204. ISSN 0304-3991. ABSTRACT

Proceedings Paper - International Conference

2016

Daniel, Benjamin; Radlička, Tomáš; Piňos, Jakub; Frank, Luděk; Müllerová, Ilona. Very low energy STEM/TOF system. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 6-7. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Radlička, Tomáš; Oral, Martin. Correction of misalignment aberrations of a hexapole corrector using the differential algebra method. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 50-53. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Rozbořil, Jakub; Oral, Martin; Radlička, Tomáš. Optimal X-ray detection for thin samples in low-energy STEM. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 44-45. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

2014

Müllerová, Ilona; Radlička, Tomáš; Mika, Filip; Krzyžánek, Vladislav; Neděla, Vilém; Sobota, Jaroslav; Zobač, Martin; Kolařík, Vladimír; Starčuk jr., Zenon; Srnka, Aleš; Jurák, Pavel; Zemánek, Pavel; Číp, Ondřej; Lazar, Josef; Mrňa, Libor. Main Activites of the Institute of Scientific Instruments. In Workshop of Interesting Topics of SEM and ESEM. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014, S. 7-8. ISBN 978-80-87441-12-1. [Workshop of Interesting Topics of SEM and ESEM, Mikulov, 26.08.2014-31.08.2014, CZ].

Oral, Martin; Radlička, Tomáš. Computations in Charged Particle Optics. In Workshop of Interesting Topics of SEM and ESEM. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014, S. 23-24. ISBN 978-80-87441-12-1. [Workshop of Interesting Topics of SEM and ESEM, Mikulov, 26.08.2014-31.08.2014, CZ].

2012

Neděla, Vilém; Konvalina, Ivo; Lencová, B.; Zlámal, J.; Jirák, J. New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes. In Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 370:1-2. ISBN 978-1-74052-245-8. [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22), Perth, 05.02.2012-09.02.2012, AU].

Oral, Martin. Fast simulation of ToF spectrometers. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 51-54. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

Radlička, Tomáš. Calculation of difraction aberration using differential algebra. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 59-62. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

2010

Lencová, Bohumila. Recent developments and improvements of EOD program. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 25-28. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Oral, Martin. Ray tracing, aberration coefficients and intensity distribution. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 49-52. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Radlička, Tomáš. Properties of Bi LMIS with ion clusters. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 57-58. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Zlámal, J.; Lencová, Bohumila. Accurate and Easy-to-use Electron Optical Design Program for Microscopy. In Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I1.6:1-2. ISBN 978-85-63273-06-2. [International Microscopy Congress (IMC17) /17./, Rio de Janeiro, 19.09.2010-24.09.2010, BR].

Contractual Research

2016

Radlička, Tomáš; Oral, Martin; Rozbořil, Jakub. SMV-2016-20: Výpočty detekčních systémů rastrovacích elektronových mikroskopů. Brno: FEI Czech Republic, s.r.o., 2016. 10 s.

Radlička, Tomáš. SMV-2016-21: DA modul pro EOD. Brno: Ing. Jakub Zlámal, Ph.D., 2016. 4 s.

2015

Radlička, Tomáš. SMV-2015-20: Analýza detekčních mechanizmů mikroskopu Teneo. Brno: FEI Czech Republic, s. r. o, 2015. 4 s.