- e-beam pattern generator Tesla BS600 developed by ISI in 1977-1987;
continuously modernized until now;
- procedures for adjusting the pattern generator;
- technological and lithographic marks; testing patterns;
- apertures forming a rectangular beam;
- current density distribution in the beam;
- electron emitters.
|
|
|
![BS600 (2017) Elektronový litograf Tesla BS600, konfigurace 2012](https://webarchiv.lib.cas.cz:443/wayback/20180901102940im_/http://ebl.isibrno.cz/2017/BS600_2012.png) |
|
E-Beam Lithography Group (EBL)
Research Areas:
Offered Technologies:
|
E-beam pattern generator Tesla BS600
- E-beam pattern generator with rectangularly shaped beam and electron energy of 15 keV.
- Recording resolution (beam positioning) of 50 nm.
- Beam size adjustable from 50 to 6300 nm (standard mode); from 17 to 2100 nm (TZ mode).
- Exposure field 3 × 3 mm2 (max).
- Proximity effect corection algorithmes.
|
|
|
![Mereni Mereni](https://webarchiv.lib.cas.cz:443/wayback/20180901102940im_/http://ebl.isibrno.cz/2017/ISI-EBL-4Methods.png) |
|
|
Comparative study: four methods for measurements of the beam current density. |
|
|
![Model hrotu Model hrotu](https://webarchiv.lib.cas.cz:443/wayback/20180901102940im_/http://ebl.isibrno.cz/2017/ISI-EBL-TipModel.png) |
|
|
Electron emitter tip (left); emission pattern (midle); tip model crystalography (right). |
|
|