Department of Image Processing

Preliminary balistic electron emission microscopy/spectroscopy characterization of InAs quantum dots in AlGaAs/GaAs heterostructure

Conference Paper (international conference)

Vaniš Jan, Henini M., Šroubek Filip, Walachová Jarmila

serial: International Conference NANO'03. Proceedings, p. 76-80 , Eds: Šandera P.

publisher: Vysoké učení technické, Fakulta strojního inženýrství, (Brno 2003)

action: NANO'03, (Brno, CZ, 21.10.2003-23.10.2003)

research: CEZ:AV0Z2067918

project(s): KSK1010104 Projekt 04/01:4045GA AV ČR

keywords: materials, measurement, electro-optical devices, quantum well devices, spectroscopy

abstract (eng):

We presented a characterization of InAs self assembled quantum dots embedded in quantum well of the AlGaAs/GaAs heterostructure using ballistic electron emission microscopy/spectroscopy BEEM/BEES. Structures are grown by MBE. Results of spectroscopic measurements "on the dot" and "out of the dot" are also presented.

Cosati: 20E, 09F

RIV: BM