The Biography – Bohuslav Rezek

Born in 1973 in Prague, Czech Republic, Bohuslav Rezek graduated from Physics at the Faculty of Mathematics and Physics at the Charles University in Prague. He continued with PhD. at Academy of Sciences of the Czech Republic (ASCR) in a group of Dr. Jan Kočka, where he studied charge transport in amorphous and microcrystalline silicon with high lateral resolution by use of  scanning probe techniques. During his PhD. he spent several research stays in a group of Prof. Martin Stutzmann at the Walter Schottky Institut, Technische Universität München. There he worked with Dr. Christoph Nebel on development of large grain silicon thin films using interference laser crystallization of amorphous silicon layers and on their investigation by laser beam induced currents with a sub-micrometer lateral resolution, with a special view to optical and electronic properties of grain boundaries. After receiving his PhD. degree in 2001, he continued in the group of Prof. Stutzmann as a postdoctoral researcher on the project for diamond devices and sensors. In the framework of this project he focused on a study and modification of hydrogen terminated diamond surfaces. In 2002 he joined the Nanotechnology Group at the Swiss Federal Institute of Technology, where he was working on a guided assembly of colloidal particles at solid state surfaces. Since 2004 he worked at the Diamond Research Center of AIST in Tsukuba, Japan, where he was doing research on surface functionalized diamond devices. In 2006 became research team leader and Purkyně Fellow at the Institute of Physics ASCR in Prague. Dr. Rezek and his colleagues are focused on nano-interfaces of semiconductors and organic materials towards opto-electronic and bio-device applications. Main interests lie in characterization and modification of material, electronic, and chemical properties by local probe techniques as well as in guided assembly of organic and inorganic nanostructures. He is author or co-author of over seventy scientific papers in reviewed journals, which were cited more than 350 times.