Reflection electron energy loss spectroscopy (REELS) at low energy is very surface sensitive and can be used to characterize the electronic properties of ultra-thin films and surface nano-structures. To extract reliable quantitative information from a REELS experiment it is essential to have accurate theoretical algorithms. In this work, we have studied the validity of a theoretical method proposed by Yubero and Tougaard to determine the dielectric function ε by analysis of an effective experimental REELS cross section determined by the Tougaard-Chorkendorff algorithm. Celý text >>
Owing to its simplicity aluminum is of fundamental importance for solid-state theory and thus has been a popular object of experimental and ab initio studies. Electronic structure of low index surfaces of aluminum has been theoretically addressed many times both within a semi-infinite crystal and within a supercell slab approach. A number of angle-resolved photoemission measurement have been reported, however, a consistent theory that would describe the observed energy distribution curves including the emission from surface states has not yet been published. Celý text >>
The research program is focused on the study of:
Research team: Karel Nitsch, Miroslava Rodová, Antonín Cihlář, Robert Král
Electronic and structural properties of solid surfaces are studied by various electron spectroscopic methods. The basic equipment is angular-resolved photoelectron spectrometer ADES-400 (VG Scientific, UK).
Fig. 1: Photoelectron spectrometer ADES-400
Celý text >>Core facilities of Laboratory of diamond thin films and carbon nanostructures consist of two unique microwave deposition systems Aixtron P6 and Roth & Rau AK 400. Both deposition systems represent a microwave plasma assisted chemical vapor deposition. At present time, the system Aixtron P6 is routinely used for growth of nanocrystalline diamond thin films (NCD) (Fig. 1). Celý text >>
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