Fyzikální ústav Akademie věd ČR

EELS (Electron Energy Loss Spectroscopy) now constitutes a major component in any new electron microscope, in particular for the characterization of solid specimens at sub nanometer level. It is commonly used for elemental mapping, in which case atomic resolution and single atom sensitivity have been demonstrated, and it has found wide areas of applications in many scientific domains. (více ...)

Abstract:
Fast development of real space local probe techniques such as Scanning Probe Microscope (SPM) has allowed the precise control and the modification of surfaces at the atomic scale. While standard STM image procedures operate mostly at so called the tunneling regime, more and more applications take place in the near-to-contact regime (see e.g. [1]) during last years. In this regime, the probe proximity strongly modifies the surface structure making the precise interpretation of experimental results more complicated. (více ...)

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