Fyzikální ústav Akademie věd ČR

The unifying characteristic of this Department is nano-characterization used to find correlation of structural, chemical and physical properties of nanostructures, thin films and interfaces. Important basis is unique nano-characterization complex (Omicron qPlus VT UHV AFM/STM, Veeco Nanoscope IV Dimension 3100 with a large variety of modes and NT-MDT NTEGRA AFM combined with Renishaw inVia Reflex Raman microspectroscopy). The research activities concentrate to four research topics, solved in the framework of the national and international projects:

• preparation and characterization of Si nanostructures and nanocrystalline thin films
• characterization, modification of atomic and electronic structure of surfaces and nanostructures, computer simulations of nanostructures and surfaces
• brightly photoluminescent silicon nanostructures as light sources for nanophotonics
• organic-inorganic nanosystems for optical electronics and bio electronics

We are participating in the following research, educational and popularization activities:

• Scanning Probe Miscroscopy Expert & Training Center of the Institute of Physics, ASCR (SET-Center)
• Material Science Beamline (at Elettra)
• Virtual Research Center for Carbon-based Biomaterials and Biointerfaces (CABIOM)
• Center of Nanotechnologies and Materials for Nanoelectronics
• Czech NanoTeam
• International Summer School on Physics at Nanoscale

and more...