PROJECT DETAILS
| Name: | Characterization of superlattices and ultra-shallow layers in semiconductors by stanning tunneling microscope and contact profilometer |
| Principal investigator: | Jarmila Walachová, Ph.D. |
| Member: | Jan Vaniš, Ph.D. |
| From: | 1994-01-01 | |
| To: | 1996-12-31 | |