PROJECT DETAILS
| Name: | Study of perspective semiconductor materials and structures by ballistic electron emission microscopy/spectroscopy and contact profilometer |
| Sponsor: | Czech Science Foundation |
| Principal investigator: | Jarmila Walachová, Ph.D. |
| Member: | Jan Vaniš, Ph.D. |
| From: | 1997-01-01 | |
| To: | 1999-12-31 | |