For Experts
Equipment
The Institute disposes of a broad scale of analytical techniques essential for characterization of solids.
Electron microscopy
- SEM (JEOL JSM -6510lv, Philips XLCP40) – SE and BSE imaging, EDS and WDS analysis, determination of film thickness
- TEM (Philips EM201) – imaging, electron diffraction (SAED)
- HRTEM (Jeol JEM-3010) – imaging, electron diffraction (SAED), EDS analysis, mapping of crystal orientation
- sample preparation
X-ray diffraction (Expert PANAnalytical)
- reflection and transmission geometries
- microdiffraction
- high-temperature measurements
Thermal analysis with mass spectrometry
- Setaram, Netzsch
Infrared spectroscopy
- Nicolet Avatar
Surface analysis
More detailed information is available in the web of Centre of Instrumental Techniques