Fyzikální ústav Akademie věd ČR

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AFM based characterization of inorganic and organic semiconductor nanostructures

Seminar Thursday, 13/10/2011 14:00 - 16:00

Speakers: Christian Teichert (Montan University, Leoben, Austria)
Place: Cukrovarnicka 10, library, block A, 1st fl.
Presented in English
Organisers: Department of Thin Films and Nanostructures

Attachments:

application/pdf iconteichert.pdf

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