Electronic and structural properties of solid surfaces are studied by various electron spectroscopic methods. The basic equipment is angular-resolved photoelectron spectrometer ADES-400 (VG Scientific, UK).
Fig. 1: Photoelectron spectrometer ADES-400
Following techniques can be used for surface analysis:
XPS – X-ray induced photoelectron spectroscopy,
UPS – Utraviolet photoelectron spectroscopy,
PhD – Photoelectron diffraction,
AES – Auger elektron spectroscopy,
EPES – Elastic peak elektron spectroscopy,
REELS – Electron energy loss spectroscopy in reflection mode,
LEED – Low energy electron diffraction.
Vacuum chamber shown in Fig. 2 is used for transport samples (layers and superstructures based on GaAs) grown by Molecular Beam Epitaxy between MBE and ADES-400 under ultrahigh vacuum condition.
Fig. 2: UHV transport chamber
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