Přednášející: Dr. Christian David (Laboratory for Micro- and Nanotechnology, Paul Scherrer Institute, Švýcarsko)
Místo: v přednáškovém sále FZÚ Na Slovance
Jazyk: anglicky
Pořadatelé:
Sekce výkonových systémů
Abstract: Diffractive x-ray optics fabricated by micro- or nanolithography techniques can be used to control the wavefront of x-rays with sub-wavelength precision. We report on the development of various devices and their application in x-ray microscopy, radiography and metrology experiments. Fresnel zone plates (FZPs) are used for full field transmission x-ray microscopes (TXM) and scanning transmission x-ray microscopes (STXM) for high resolution imaging and analysis. In addition we have developed an interferometric hard x-ray phase imaging technique based on diffraction gratings, which can be used for phase contrast imaging and wave front metrology. As the technique does not require any coherence it can also be applied to x-ray tube sources, making it suitable for applications in medical imaging. In addition, we report on first experiments carried out with hard x-rays from the free-electron laser LCLS in Stanford.
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