Study of perspective semiconductor materials and structures by ballistic electron emission microscopy/spectroscopy and contact profilometer

Sponsor: Czech Science Foundation

Principal investigator: Jarmila Walachová, Ph.D.

Member: Jan Vaniš, Ph.D.

From: 1997-01-01

To: 1999-12-31


 

 

 

 

 

 

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Data box: m54nucy

IČ: 67985882
DIČ: CZ67985882

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