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Speakers: Dr. Otakar Frank (Department of Electrochemical Materials, J. Heyrovský Institute of Physical Chemistry, v.v.i.)
Place: Cukrovarnická 10, building A, library, 1st floor
Presented in English
Organisers:
Department of Thin Films and Nanostructures
Raman spectroscopy is the undisputed method of choice for a simple, fast and non-destructive characterization of graphene. Its capabilities go far beyond the commonly used assessment of quality a layer number. The lecture will review some of the recent advances as well as pitfalls in determining various states and properties of graphene systems, like disentangling strain level and charge carrier concentration, determining bending rigidity or investigating interaction between individual layers in bilayer graphene.
Copyright © 2008-2010, Fyzikální ústav AV ČR, v. v. i.
