|
|
Close Help | ||||||||||||||
Lomov, A. A. ; Grym, Jan ; Nohavica, Dušan ; Orehov, A.S. ; Vasil'ev, A. L. ; Novikov, D. V. High-resolution X-ray diffraction and electron microscopy study of porous GaAs substrates. In Orlikovsky, A.A. (ed.). International Conference Micro- and Nano-Electronics 2012 (Proc. SPIE 8700). BELLINGHAM : SPIE (2013)
