Bok Jan

ASEP Publications

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Records found: 16

0367106 - UPT-D 2012 IT eng C - Proceedings Paper (International conf.)
Bok, Jan - Schauer, Petr
Afterglow of YAG:Ce single crystal scintillators for S(T)EM electron detectors.
Proceedings of the 10th Multinational Congress on Microscopy 2011. Urbino : SISM, 2011, s. 61-62.
[Multinational Congress on Microscopy 2011 /10./ - MCM 2011. Urbino (IT), 04.09.2011-09.09.2011]
R&D Projects: GA ČR GAP102/10/1410; GA MŠk ED0017/01/01
Institutional Support: CEZ:AV0Z20650511
Keywords: electron detection * scintillator * YAG:Ce * afterglow * time response
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Permanent link: http://hdl.handle.net/11104/0201885

0397634 - UPT-D 2014 RIV US eng J - Journal Article
Bok, Jan - Kolařík, Vladimír - Horáček, Miroslav - Matějka, Milan - Matějka, František
Modified knife-edge method for current density distribution measurements in e-beam writers.
Journal of Vacuum Science & Technology B. Roč. 31, č. 3 (2013), 031603:1-6. ISSN 1071-1023
R&D Projects: GA MŠk ED0017/01/01; GA TA ČR TE01020118
Institutional Support: RVO:68081731
Keywords: electron-beam * intensity distribution * aperture * detector * profile * size
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Impact factor: 1.358, year: 2013
Permanent link: http://hdl.handle.net/11104/0225249

0430353 - UPT-D 2015 RIV GB eng J - Journal Article
Bok, Jan - Schauer, Petr
Apparatus for temperature-dependent cathodoluminescence characterization of materials.
Measurement Science and Technology. Roč. 25, č. 7 (2014), 075601:1-7. ISSN 0957-0233
R&D Projects: GA TA ČR TE01020118; GA ČR(CZ) GA14-20012S
Institutional Support: RVO:68081731
Keywords: cathodoluminescence * electron beam * cryostat * scintillator * YAG:Ce
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Impact factor: 1.352, year: 2013
Permanent link: http://hdl.handle.net/11104/0235310

0430357 - UPT-D 2015 RIV US eng J - Journal Article
Bok, Jan - Schauer, Petr
Performance of SEM Scintillation Detector Evaluated by Modulation Transfer Function and Detective Quantum Efficiency Function.
Scanning. Roč. 36, č. 4 (2014), s. 384-393. ISSN 0161-0457
R&D Projects: GA TA ČR TE01020118; GA ČR GAP102/10/1410; GA MŠk EE.2.3.20.0103
Institutional Support: RVO:68081731
Keywords: MTF * DQE * image detection * scintillator * e-beam scanning
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Impact factor: 1.435, year: 2013
Permanent link: http://hdl.handle.net/11104/0235314

0368131 - UPT-D 2012 RIV US eng J - Journal Article
Bok, Jan - Schauer, Petr
LabVIEW-based control and data acquisition system for cathodoluminescence experiments.
Review of Scientific Instruments. Roč. 82, č. 11 (2011), 113109:1-6. ISSN 0034-6748
R&D Projects: GA ČR GAP102/10/1410
Institutional Support: CEZ:AV0Z20650511
Keywords: cathodoluminescence (CL) * LabVIEW * data acquisition
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Impact factor: 1.367, year: 2011
Permanent link: http://hdl.handle.net/11104/0202563

0390975 - UPT-D 2013 RIV CZ eng C - Proceedings Paper (International conf.)
Bok, Jan - Horáček, Miroslav - Král, Stanislav - Kolařík, Vladimír - Matějka, František
Analysis of electron current instability in E-beam writer.
NANOCON 2012, 4th International Conference Proceedings. Ostrava : TANGER Ltd, 2012, s. 295-299. ISBN 978-80-87294-32-1.
[NANOCON 2012. International Conference /4./. Brno (CZ), 23.10.2012-25.10.2012]
R&D Projects: GA MŠk ED0017/01/01; GA TA ČR TE01020118; GA MPO FR-TI1/576
Institutional Support: RVO:68081731
Keywords: electron beam * current measurement * current drift and noise * fourier analysis
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Permanent link: http://hdl.handle.net/11104/0219831

0420839 - UPT-D 2014 DE eng C - Proceedings Paper (International conf.)
Bok, Jan - Schauer, Petr
Mechanism of electron-photon conversion in YAG: Ce scintillator for SEM electron detectors.
Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg : University of Regensburg, 2013, s. 121-122.
[Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
R&D Projects: GA MŠk EE.2.3.20.0103; GA TA ČR TE01020118
Institutional Support: RVO:68081731
Keywords: Everhart-Thornley scintillation detector * cathodoluminiscence * image quality
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Permanent link: http://hdl.handle.net/11104/0227361

0421042 - UPT-D 2014 CN eng C - Proceedings Paper (International conf.)
Bok, Jan - Schauer, Petr
Two-state model for cathodoluminiscence kinetics of YAG:Ce single-crystal scintillators.
Proceedings of the 12th International Conference on Inorganic Scintillators and Their Applications. Shanghai : Shaghai Institute of Ceramic, CAS, 2013, s. 18.
[SCINT 2013. International Conference on Inorganic Scintillators and Their Applications /12./. Shanghai (CN), 15.04.2013-19.04.2013]
R&D Projects: GA TA ČR TE01020118; GA ČR GAP102/10/1410; GA MŠk EE.2.3.20.0103
Institutional Support: RVO:68081731
Keywords: scintillator * YAG:Ce * cathodoluminiscence
Subject RIV: BH - Optics, Masers, Lasers
Permanent link: http://hdl.handle.net/11104/0227465

0386385 - UPT-D 2013 RIV CZ eng C - Proceedings Paper (International conf.)
Bok, Jan - Kolařík, Vladimír
Measurements of current density distribution in e-beam writer.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno : Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 7-8 ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
R&D Projects: GA MŠk ED0017/01/01; GA MPO FR-TI1/576
Institutional Support: RVO:68081731
Keywords: measurement of current density * e-beam writer
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Permanent link: http://hdl.handle.net/11104/0215682

0386386 - UPT-D 2013 RIV CZ eng C - Proceedings Paper (International conf.)
Bok, Jan - Schauer, Petr
Quality assessment of scintillation detector in SEM using MFT.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno : Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 9-10 ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
R&D Projects: GA ČR GAP102/10/1410; GA MŠk EE.2.3.20.0103
Institutional Support: RVO:68081731
Keywords: scintillation detector in SEM * modulation transfer function * e-beam scanning speed
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Permanent link: http://hdl.handle.net/11104/0215685

0390976 - UPT-D 2013 RIV CZ eng C - Proceedings Paper (International conf.)
Kolařík, Vladimír - Matějka, Milan - Matějka, František - Krátký, Stanislav - Urbánek, Michal - Horáček, Miroslav - Král, Stanislav - Bok, Jan
Calibration specimens for microscopy.
NANOCON 2012, 4th International Conference Proceedings. Ostrava : TANGER Ltd, 2012, s. 713-716. ISBN 978-80-87294-32-1.
[NANOCON 2012. International Conference /4./. Brno (CZ), 23.10.2012-25.10.2012]
R&D Projects: GA MŠk ED0017/01/01; GA TA ČR TE01020233; GA MPO FR-TI1/576
Institutional Support: RVO:68081731
Keywords: E-beam technology * calibration specimen * scanning electron microscopy
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Permanent link: http://hdl.handle.net/11104/0219838

0390983 - UPT-D 2013 RIV CZ eng C - Proceedings Paper (International conf.)
Kolařík, Vladimír - Horáček, Miroslav - Matějka, František - Matějka, Milan - Urbánek, Michal - Krátký, Stanislav - Král, Stanislav - Bok, Jan
E-beam pattern generator BS600 and technology zoom.
NANOCON 2012, 4th International Conference Proceedings. Ostrava : TANGER Ltd, 2012, s. 822-825. ISBN 978-80-87294-32-1.
[NANOCON 2012. International Conference /4./. Brno (CZ), 23.10.2012-25.10.2012]
R&D Projects: GA MŠk ED0017/01/01; GA MPO FR-TI1/576
Institutional Support: RVO:68081731
Keywords: E-beam pattern generator * E-beam lithography * reduced size shaped beam
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Permanent link: http://hdl.handle.net/11104/0219948

0386391 - UPT-D 2013 RIV CZ eng C - Proceedings Paper (International conf.)
Kolařík, Vladimír - Matějka, František - Matějka, Milan - Horáček, Miroslav - Urbánek, Michal - Bok, Jan - Krátký, Stanislav - Král, Stanislav - Mika, Filip
What is the buzz about the TZ mode.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno : Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 37-38 ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
R&D Projects: GA ČR GA102/05/2325; GA MŠk ED0017/01/01
Institutional Support: RVO:68081731
Keywords: e-beam lithography * variable shaped electron beam
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Permanent link: http://hdl.handle.net/11104/0215691

0397715 - UPT-D 2014 RIV NL eng J - Journal Article
Schauer, Petr - Bok, Jan
Study of spatial resolution of YAG:Ce cathodoluminescent imaging screens.
Nuclear Instruments & Methods in Physics Research Section B. Roč. 308, 1 August (2013), s. 68-73. ISSN 0168-583X
R&D Projects: GA TA ČR TE01020118; GA ČR GAP102/10/1410; GA MŠk EE.2.3.20.0103
Institutional Support: RVO:68081731
Keywords: Spatial resolution * Imaging screen * Electron microscope * Cathodoluminescence * YAG:Ce single crystal * Line spread function * Modulation transfer function
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Impact factor: 1.186, year: 2013
Permanent link: http://hdl.handle.net/11104/0225349

0386399 - UPT-D 2013 RIV CZ eng C - Proceedings Paper (International conf.)
Schauer, Petr - Bok, Jan
Current state and prospects of scintillation materials for detectors in SEM.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno : Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 67-68 ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
R&D Projects: GA ČR GAP102/10/1410; GA MŠk EE.2.3.20.0103
Institutional Support: RVO:68081731
Keywords: SEM * scintillation materials
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Permanent link: http://hdl.handle.net/11104/0215698

0390977 - UPT-D 2013 RIV CZ eng C - Proceedings Paper (International conf.)
Urbánek, Michal - Kolařík, Vladimír - Matějka, Milan - Matějka, František - Bok, Jan - Mikšík, P. - Vašina, J.
Shaped E-beam nanopatterning with proximity effect correction.
NANOCON 2012, 4th International Conference Proceedings. Ostrava : TANGER Ltd, 2012, s. 717-722. ISBN 978-80-87294-32-1.
[NANOCON 2012. International Conference /4./. Brno (CZ), 23.10.2012-25.10.2012]
R&D Projects: GA MPO FR-TI1/576; GA MŠk ED0017/01/01; GA TA ČR TE01020233
Institutional Support: RVO:68081731
Keywords: e-beam writer * shaped beam * proximity effect correction
Subject RIV: JA - Electronics & Optoelectronics, Electrical Engineering
Permanent link: http://hdl.handle.net/11104/0219844