Semián Vladimír

ASEP Publications

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Records found: 2

0392289 - UJF-V 2014 RIV GB eng J - Journal Article
Jakůbek, M. - Jakůbek, J. - Žemlička, J. - Platkevič, M. - Havránek, Vladimír - Semián, Vladimír
3D imaging of radiation damage in silicon sensor and spatial mapping of charge collection efficiency.
Journal of Instrumentation. Roč. 8, č. 3 (2013), C03023. ISSN 1748-0221.
[14th International Workshop on Radiation Imaging Detectors. Figueira da Foz, Coimbra, 01.07.2012-05.07.2012]
R&D Projects: GA TA ČR TA01010237; GA ČR(CZ) GA103/09/2101
Institutional Support: RVO:61389005 ; RVO:68378297
Keywords: solid media * radiation damage * Pixelated detectors
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders; JL - Materials Fatigue, Friction Mechanics
Impact factor: 1.526, year: 2013
http://iopscience.iop.org/1748-0221/8/03/C03023/pdf/1748-0221_8_03_C03023.pdf
Permanent link: http://hdl.handle.net/11104/0221246

0392531 - UJF-V 2014 RIV GB eng J - Journal Article
Platkevič, M. - Jakůbek, J. - Havránek, Vladimír - Jakůbek, M. - Pospíšil, S. - Semián, Vladimír - Žemlička, J.
Evaluation of local radiation damage in silicon sensor via charge collection mapping with the Timepix read-out chip.
Journal of Instrumentation. Roč. 8, April 2013 (2013), C04001. ISSN 1748-0221.
[14th International Workshop on Radiation Imaging Detectors. Figueira da Foz, Coimbra, 01.07.2012-05.07.2012]
Institutional Support: RVO:61389005
Keywords: solid state detectors * radiation damage evaluation methods * pixelated detectors and associated VLSI eletronics * radiation damage to detector materials
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Impact factor: 1.526, year: 2013
http://iopscience.iop.org/1748-0221/8/04/C04001/pdf/1748-0221_8_04_C04001.pdf
Permanent link: http://hdl.handle.net/11104/0221379