Přednášející: Prof. Jordi Arbiol (Institució Catalana de Recerca i Estudis Avançats, Institut de Ciència de Materials de Barcelona)
Místo: přednáškový sál FZÚ AV ČR, Na Slovance 2, Praha 8
Jazyk: anglicky
Pořadatelé:
Oddělení funkčních materiálů
Technology at the nanoscale has become one of the main challenges in science as new physical effects appear and can be modulated at will. Superconductors, materials for spintronics, electronics, optoelectronics, chemical sensing, and new generations of functionalized materials are taking advantage of the low dimensionality, improving their properties and opening a new range of applications. As developments in materials science are pushing to the size limits of physics and chemistry, there is a critical need for understanding the origin of these unique physical properties (optical and electronic) and relate them to the changes originated at the atomic scale, e.g.: linked to changes in (electronic) structure of the material.
During the seminar, I will show how combining advanced electron microscopy imaging with electron spectroscopy, as well as cathodoluminescence in an aberration corrected STEM will allow us to probe the elemental composition and electronic structure simultaneously with the optical properties in unprecedented spatial detail.
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