Wayback Machine
«FEB APR JUN »
Previous capture 11 Next capture
«2014 2015 2016 »
120 captures
5 Apr 14 - 1 Mar 25
Close Help

RNDr. Jan Lorinčík, CSc.

Pozice: 
Vědecký pracovník
Tým: 
Příprava a charakterizace nanomateriálů
Telefon: 
+420 266 773 428
+420 266 773 570
Fax: 
+420 284 680 222
E-mail: 
lorincik@ufe.cz
Lokalita: 
Hlavní budova ÚFE, Praha 8 - Kobylisy
Místnost: 
I/7

Oblasti vědeckého zájmu:

  • Ion-surface interactions, sputtering, emission of secondary ions, ion-induced electron emission
  • Ion beam diagnostic methods (FIB, SIMS, SNMS), fundamentals, applications, instrumentation
  • UHV technology and Physics of thin Films
  • Analytical methods in Surface Science and Material Research

Profesní činnost:

2008 - today: Senior Research Scientist, Institute of Photonics and Electronics of the Academy of Sciences of the Czech Republic

2007 - today: Member of the Board of Institute, Institute of Photonics and Electronics of the Academy of Sciences of the Czech Republic

2006 – today: Research Scientist, Institute of Photonics and Electronics of the Academy of Sciences of the Czech Republic; Research Scientist, Department of Physics, Faculty of Science, J.E. Purkyne University, Usti nad labem, Czech Republic

2003 – 2005: Research Scientist, Arizona State University, Tempe, USA

2002: Research Scientist, University of Virginia, Charlottesville, USA

1997 – 2001: Research Scientist, Institute of Physical Chemistry of the Academy of Sciences of the Czech Republic

1994 – 1997: Guest Scientist, National Institute of Standards and Technology, Gaithersburg, USA

1989 – 1995: Research Scientist, Institute of Physical Chemistry of the Academy of Sciences of the Czech Republic

1985 – 1989: Ph.D. student, Department of Electronics and Vacuum Physics, Faculty of Mathematics and Physics, Charles University, Prague

1986: Member of the Czechoslovak Union of Mathematicians and Physicists

Vzdělání:  

1991 - CSc. (equivalent of Ph.D.) in Quantum Electronics and Optoelectronics, Faculty of Mathematics and Physics, Charles University, Prague

1984 - RNDr. (equivalent of MSc.) in Physical Electronics, Faculty of Mathematics and Physics, Charles University, Prague

Současné projekty:

Řešitel projektů:

Člen projektů:

Vybrané předchozí projekty:

Řešitel projektů:

  • Micro-Faraday array detektor s vysokým dynamickým rozsahem pro multikolekční izotopický SIMS
  • Iontově indukovaná kinetická elektronová emise z kovů
  • Kvantitativní analýza prvků vzácných zemin v InP pomocí metody SIMS
  • Elektronová emise způsobená dopadem iontů na povrchy materiálů perspektivních pro výzkum termojaderné syntézy
  • Electron and ion emission from tokamak-first-wall materials induced by impact of atomic particles
  • Vznik vícenásobných iontů a elektronické efekty při odprašování iontových sloučenin při nízkých energiích
  • Slow ion induced electron emission and surface modification for insulators

Spoluřešitel projektů:

Člen projektů:

Publikační činnost:

Knihy:

    1. J. Lörinčík, Z.Šroubek, Z.Bastl, “Hmotnostní spektrometrie sekundárních iontů (SIMS)” v knize Metody analýzy povrchů – iontové, sondové a speciální metody, eds. L. Frank, J. Král, str. 147 – 201, 2002, Academia Praha.

      Odborné časopisy:

        1. P. Williams, J. Lorincik, K. Franzreb, and R. Hervig, „High dynamic range isotope ratio measurements using an analog electron multiplier“, Surf. Interface Anal. (2012) in print, DOI 10.1002/sia.5048
        2. P. Kuba, J. Lorincik, C. Anders, and H. Urbassek, „A molecular dynamics simulation of the effect of near-surface gas-pgase collisions on final velocities of sputtered ions“, Surf. Interface Anal. (2012) in print, DOI 10.1002/sia.4964
        3. B. Stepanov, T. Wagner, J. Lorincik, M. Frumar, M. Churbanov, and Yu. Chigirinski, „Solid State Field-Assisted Diffusion in (TeO2)0.6(WO3)0.25(La2O3)0.05(Na2O)0.1 Glass“, “, Inorg. Mat. 48 (2012) 642 – 647 
        4. L Fekete, H Němec, Z Mics, F Kadlec, P Kužel, V Novák, J. Lorinčík, M Martin, J Mangeney, J C Delagnes, and P Mounaix, Ultrafast carrier response of Br+-irradiated In0.53Ga0.47As excited at telecommunication wavelengths, J. Appl. Phys. 111 (2012) 093721 1-8 
        5. M. Negyesi, J. Burda, V. Kloucek, J. Lorincik, J. Sopousek, J. Kabatova, L. Novotny , S. Linhart, T. Chmela, J. Siegl, and V. Vrtilkova, „Contribution to the study of the pseudobinary Zr1Nb–Oxygen phase diagram by local oxygen measurements of Zr1Nb fuel cladding after high temperature oxidation”, J. Nucl. Mat. 420 (2012) 314 – 319. 
        6. M. Drabik, A. Chokourov, A. Artmenko, J. Matousek, O. Polonskyi, P. Solar, J. Pesicka, J. Lorincik, D. Slavinska, H. Biederman, „Aging of nanocluster Ti/TiOx films prepared by means of gas aggregation cluster source“, Surface & Coatings Technology 205 (2011) S48 – S52. 
        7. B. Stepanov, J. Ren, T. Wagner, J. Lorincik, M. Frumar, M. Churbanov, Y. Chigirinski, „Solid state field-assisted diffusion of copper in multi-component tellurite glasses“, “, J. Am. Ceram. Soc. 94 (2011) 1986 – 1988. 
        8. B. Stepanov, J. Ren, T. Wagner, J. Lorincik, M. Frumar, M. Churbanov, „Solid state field-assisted Ag diffusion in Ge-Ga-Sb-S glasses“, J. Am. Ceram. Soc. 94 (2011) 1756 – 1760. 
        9. B. Stepanov, J. Ren, T. Wagner, J. Lorincik, M. Frumar, M. Churbanov, Y. Chigirinski, „Solid state field-assisted diffusion of silver in multi-component tellurite glasses“, J. Non-Cryst. Solids 357 (2011) 3022 – 3026. 
        10. J. Lorincik, M. Bonner Denton, R. P. Sperline, E. T. Young, and P. Williams, “Testing of micro Faraday array for ion detection in SIMS”, Analytical Letter 44 (2011) 1050 - 1057. 
        11. J. Lorincik, V. Kloucek, M. Negyesi, J. Kabatova, L. Novotny , and V. Vrtilkova, “SIMS and thermal evolution analysis of oxygen in Zr-1%Nb alloy after high-temperature transitions”, Surf. Interface Anal. 43 (2011) 618 – 620. 
        12. P. Williams, K. Franzreb, R. C. Sobers Jr, and J. Lorincik, “On the effect of oxygen flooding on the detection of noble gas ions in a SIMS instrument”, Nucl. Instrum. Meth. Phys. Res. B 268 (2010) 2758 – 2765. 
        13. R. Zeipl, J. Walachová, J. Lorinčík, S. Leshkov, M. Josieková, M. Jelínek, T. Kocourek, K. Jurek, J. Navrátil, L. Beneš, T. Plecháček, “Properties of thin N-type Yb0.14Co4Sb12 and P-type Ce0.09Fe0.67Co3.33Sb12 skutterudite layers prepared by laser ablation”, J. Vac. Sci. Technol. A 28 (2010) 523 – 527. 
        14. K. Zdansky, J. Zavadil, P. Kacerovsky, J. Lorincik, A. Fojtik, “Deposition of Pd Nanoparticles on InP by Electrophoresis: Dependence on Electrode Polarity”, IEEE Transaction on Nanotechnology 9 (2010) 355 – 360.    
        15. K. Zdansky, J. Zavadil, P. Kacerovsky, J. Lorincik, J. Vanis, F. Kostka, O. Cernohorsky, A. Fojtik, J. Reboun, J. Cermak, “Electrophoresis deposition of metal nanoparticles with reverse micelles onto InP”, Int. J. Mat. Res. 100 (2009) 1234 – 1238. 
        16. J. Lorincik, Z. Sroubek, M. Brunmayr, G. Kowarik, F. Aumayr, “Kinetic electron emission due to perpendicular impact of carbon ions on tungsten”, Appl. Surf. Sci. 255 (2009) 6303 – 6307. J. Fišer, K. Franzreb, J. Lorinčík, P. Williams, “Oxygen containing diatomic dications in the gas phase“, European Journal of Mass Spectrometry 15 (2009) 315 – 324. 
        17. O. Procházková, J. Grym, J. Zavadil, J. Lorinčík, K. Žďánský, “Influence of Yb and Yb2O3 addition on the properties of InP layers”, J. Optoel. Adv. Mat. 10 (2008) 3261 – 3264. 
        18. J. Lorincik, Z. Sroubek, “Oxygen O18 method and the search for the ionization mechanism in sputtering of oxygenated surfaces”, Appl. Surf. Sci. 255 (2008) 1201 - 1205. 
        19. K. Zdansky, P. Kacerovsky, J. Zavadil, J. Lorincik, A. Fojtik, “Layers of nanoparticles on semiconductors deposited by electrophoresis from solutions with reverse micelles”, Nanoscale Research Letters 2(9) (2007) 450 - 454. 
        20. J. Lorinčík, “Analýza tenkých vrstev metodou SIMS” (Thin film analysis by SIMS technique), Bulletin of the Czech vacuum Society 15 (1-2) (2007) 32 – 40. (in Czech) 
        21. J. Toušek, J. Toušková, A. Poruba, P. Hlídek, J. Lorinčík, “Effect of silicon nitride layers on the minority carrier diffusion length in c-Si wafers”, J. Appl. Phys. 100 (2006) 113716-1 – 6. 
        22. P. Williams, R. C. Sobers Jr, K. Franzreb, and J. Lorincik, “Quantitative fundamental SIMS studies using O18 implant standards”, Appl. Surf. Sci. 252 (2006) 6429-6432. 
        23. J. Lorincik, R. Hervig, K. Franzreb, G. Slodzian, and P. Williams, “Isotope Ratio Measurement with a Multicollector Detector on the Cameca IMS nf”, Appl. Surf. Sci. 252 (2006) 7301-7303. 
        24. K. Franzreb, R. C. Sobers Jr, J. Lorincik, and P. Williams, “Observation of small long-lived diatomic dications BeH++ and BeD++”, Phys. Rev. A 71 (2005) 024701. 
        25. K. Franzreb, J. Hrusak, M. E. Alikhani, J. Lorincik, R. C. Sobers Jr, and P. Williams, “Gas-phase diatomic trications of Se2+++, Te2+++, and LaF+++”, J. Chem. Phys. 121 (24) (2004) 12293 - 12302. 
        26. K. Franzreb, J. Lorincik, and P. Williams, “Quantitative study of oxygen enhancement of sputtered ion yields. I. Argon ion bombardment of silicon surface with O2 flood”, Surf. Sci. 573 (2004) 291 – 309. 
        27. K. Franzreb, R. C. Sobers Jr, J. Lorincik, and P. Williams, “Detection of the diatomic dications SiH2++ and AlH2++”, Appl. Surf. Sci. 231 – 232 (2004) 82 –85. 
        28. J. Lorincik, K. Franzreb, and P. Williams, “SIMION modeling of ion optical effects in Cameca ion microanalysers: simulation of ion transmission losses”, Appl. Surf. Sci. 231 – 232 (2004) 921 –925. 
        29. K. Franzreb, R. C. Sobers Jr, J. Lorincik, and P. Williams, “Formation of doubly positively charged diatomic ions Mo2++ produced by Ar+ sputtering of an Mo metal surface”, J. Chem. Phys. 120 (17) (2004) 7983- 7986. 
        30. K. Franzreb, P. Williams, Jan Lorincik, and Z. Sroubek, “ Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O2+ bombardment”, Appl. Surf. Sci. 203 – 204 (2003) 39 – 42. 
        31. Jan Lorincik, Zdenek Sroubek, “Doubly charged ion emission in sputtering of monocrystalline fluorides”, Nucl. Instrum. Methods Phys. Res., Section B, 187 (2002) 447 – 450. 
        32. HP. Winter, F. Aumayr, J. Lorincik, and Z. Šroubek, " A close look to subthreshold kinetic emission from clean metal surfaces: Surface-assisted kinetic emission and potential excitation of plasmons”, Izv. Akad. Nauk. Ser. Fiz. 66(4) (2002) p. 548 – 550. 
        33. J. Lorincik, Z.Sroubek, S. Cernusca, A. Diem, HP.Winter, and F.Aumayr, “ion induced kinetic electron emission from highly oriented pyrolytic graphite by impact of H+, C+, N+, and O+ “ Surface Science (2002) 59 – 65. 
        34. S. Cernusca, A. Diem, HP.Winter, F.Aumayr, J. Lorincik, and Z.Sroubek “Kinetic electron emission from highly oriented pyrolytic graphite surfaces induced by singly charged ions“, Nucl. Instrum. Methods Phys. Res., Section B, 193 (2001) 616 – 620. 
        35. J. Lörinčík, “Hmotnostní spektrometrie sekundárních iontů (SIMS)”, Zpravodaj České vakuové společnosti 9(2) (2001) 11 – 38. 
        36. HP. Winter, H. Eder, F. Aumayr, J. Lorincik, and Z. Šroubek, " Slow-ion induced electron emission from clean metal surfaces: Subthreshold kinetic emission and potential excitation of plasmons", Nucl. Instrum. Methods Phys. Res., Section B, 182 (2001) 15 – 22. 
        37. J. Lörincík, Z. Šroubek, F. Aumayr, and HP. Winter," Electron emission by autodetachment from doubly excited H-** in grazing incidence of protons on clean Al(111)", Europhys. Lett., 54 (2001) 633 – 639. 
        38. J.Lorincik, Z.Sroubek, H.Eder, F.Aumayr, and HP.Winter, "Kinetic electron emission from clean polycrystalline gold induced by impact of C+, N+, O+, Ne+, Xe+, and Au+ ions," Phys.Rev.B 62, No. 23 (2000) 16116 - 16125. 
        39. Z.Sroubek and J.Lorincik, " Electronic excitations in solids during impact of atomic particles," Vacuum, 56 (2000) 263-267. 
        40. J.Lorincik and Z.Sroubek, "Non-adiabatic electron excitation in ion-induced kinetic electron emission from metal surfaces," Nucl. Instrum. Methods Phys. Res., Section B, 164-165 (2000) 633-640. 
        41. Sroubek Z. and Lorincik J.," Ionization and excitation processes in sputtering in the light of the experimental evidence," Surface Review and Letters, Vol. 6, No. 2 (1999) 257-264. 
        42. Lorincik J. and Sroubek Z., "Linear time-of-flight mass spectrometer for studies of electronic effects in low energy neutral or ion sputtering,"Journal of Electrical Engineering, 49 No.9-10 (1998) 248 - 254 . 
        43. Lorincik J., Fine J., and Gillen G., "The scanning scattering microscope for surface and buried interface roughness and defect imaging," in SPIE Proceedings Vol. 3141 (1997) 302 - 315. 
        44. Lorincik J. and Fine J., "Focusing properties of hemispherical mirrors for total integrating scattering instruments," Appl. Opt., vol. III (1997) pp. 8270 - 8274. 
        45. Fine J., Lorincik J., Andreadis T.D., Franzreb K., and Sroubek Z., "High-energy electron emission from ion-bombarded surfaces of Ga, Ge, In and Sn," Nucl. Instrum. Methods Phys. Res., Section B, vol. 122, no. 2, pp. 199 - 214, 1997. 
        46. Lorincik J., Marton D., King R.L., and Fine J., "Scanning scattering microscope for surface microtopography and defect imaging," J. Vac. Sci. Technol. B 14: (4) 2417 - 2423 1996. 
        47. J.Lorincik, Z.Sroubek, R.Polak and I.Paidarova, "A comparartive study of the Variable Screening Model and Hartree-Fock methods for Calculation of Correlation diagrams of Diatomic Molecules," Collect.Czech.Chem.Commun. 60:(2) 161 -171 FEB 1995. 
        48. J.Lorincik, Z.Sroubek and H.Gnaser, "Doubly Charged Ion Emission in Sputtering of Lanthanum Trifluoride," Surface Science 314: (3) 373-377 AUG 1 1994. 
        49. M.Nikl, J.A.Mares, E.Mihokova, K.Blazek and J.Lorincik, "Energy Transfer in CeF and CeF:Cd Single Crystals," Journal of Luminiscence, 60-1: 971-974 APR 1994. 
        50. J.Lorincik, Z.Sroubek and Z.Bastl, "Electronic Effects in Low-Energy Ion Sputtering of Rare Earth Trifluorides," Radiation Effects and Defects in Solids, 1994, Vol.128, 127-133. 
        51. Hrach R., J.Lorincik, M.Sobotka and V.Hrachova, "Study of Thin Film Growth by Means of Mathematical Morphology Methods," Int. Journal of Electronics, 73/5, 973-975 (1992). 
        52. Lorincik J., "The quantitative analysis of discontinuous silver films with XPS and TEM," Appl.Surf. Sci., 62 (1992) 89-96.

          Příspěvky na konferencích:

            1. P. Kuba, J. Lorincik, M. Lisal, and H. Urbassek, „Molecular Dynamics Simulations of Subsurface Ar Bubble Rupture in Copper after the Impact of Ar Atoms“, 25th International Conference on Atomic Collisions in Solids, October 21-25, 2012n Kyoto, Japan
            2. J. Lorincik, Z. Sroubek, M. Kormunda, J. Matousek, P. Hedbavny, and J. Pavlik, „Kinetic electron emission from Cu induced by impact of slow Cs+ ions“, 25th International Conference on Atomic Collisions in Solids, October 21-25, 2012n Kyoto, Japan. 
            3. P. Kuba, J. Lorincik, M. Lisal, and H. Urbassek, „Molecular dynamics simulations of Ar cluster ejection from subsurface bubbles during sputtering of copper“,8th European Workshop on Secondary Ion Mass Spectrometry SIMS Europe 2012, September 9 - 11, 2012, Münster, Germany. 
            4. P. Williams, J. Lorincik, K. Franzreb, R. L. Hervig, „High dynamic range isotope ratio measurements using analog electron multiplier“, 18th International Conference on Secondary Ion Mass Spectrometry, September 18 – 23, 2011, Riva del Garda, Italy 
            5. G. Prudon, C. Dubois, J. Lorincik, B. Gautier, J.C. Dupuy, B. Canut, Y. Le Gall, D. Muller, “SIMS quantification of SiGe alloys using the Isotopic Comparative Method”, 18th International Conference on Secondary Ion Mass Spectrometry, September 18 – 23, 2011, Riva del Garda, Italy 
            6. J. Macak, J. Lorincik, M. Lisal, „Molecular dynamics simulations of Ar cluster ejection from subsurface bubbles during sputtering of copper“, 18th International Conference on Secondary Ion Mass Spectrometry, September 18 – 23, 2011, Riva del Garda, Italy 
            7. P. Kuba, J. Lorincik, C. Anders, Z. Sroubek, H. Urbassek, „Estimation of ion formation probabilities from molecular dynamics simulations of low energy Ar+ sputtering of copper“, 18th International Conference on Secondary Ion Mass Spectrometry, September 18 – 23, 2011, Riva del Garda, Italy 
            8. M. Négyesi, L. Novotný, J. Kabátová, S. Linhart, V. Klouček, J. Lorinčík, Vera Vrtílková, „Proposal of New “Oß” Oxidation Criterion for New Types of Zr1Nb Alloys of Fuel Claddings“, Nuclear Energy for New Europe 2011, September 12 – 15, 2011, Bovec, Slovenia. 
            9. P. Kuba, J. Lorincik, C. Anders, H. Urbassek, „Molecular dynamics simulations of low energy Ar+ sputtering of copper supplemented by ion formation calculations“,7th European Workshop on Secondary Ion Mass Spectrometry SIMS Europe 2010, September 19 - 21, 2010, Münster, Germany 
            10. J. Lorincik, V. Kloucek, M. Negyesi, J. Kabatova, L. Novotny , and V. Vrtilkova, “SIMS and thermal evolution analysis of oxygen in Zr-1%Nb alloy after high-temperature transitions”, The 17th International Conference on Secondary Ion Mass Spectrometry, September 13 – 18, 2009, Toronto, Canada. 
            11. K. Zdansky, J. Zavadil, P. Kacerovsky, F. Kostka, J. Lorincik, O. Cernohorsky, M. Muller, M. Kostejn, and A. Fojtik, Proc. NANOCON 2009, No. 60, ps. 1-9, ISBN: 978-80-87294-12-3, 1st NANOCON International Conference, OCT 20-22, 2009, Roznov pod Radhostem, Czech republic. 
            12. K. Zdansky, J. Zavadil, P. Kacerovsky, J. Lorincik, J. Vanis, F. Kostka, O. Cernohorsky, A. Fojtik, J. Reboun, and J. Cermak, “Electrophoresis Deposition of Metal Nanoparticles with Reverse Micelles onto InP”, Proceedings of the 11th International Symposium on Physics of Materials, 24 – 28 August 2008, Prague, Czech Republic. 
            13. M. Jelínek, T. Kocourek, K. Jurek, R. Zeipl, J. Walachová, J. Zelinka, J. Vaniš, J. Lorinčík, S. Leshkov, M. Josieková, J. Navrátil, L. Beneš, T. Plecháček, “Properties of thin layers of Yb0.19Co4Sb12 prepared by laser ablation”, E-MRS 2008 Spring Meeting, Symposium M: Unconventional thermoelectrics: from new materials to energy conversion devices, May 26 - May 30, 2008, Strassbourg, France. 
            14. O. Procházková, J. Grym, J. Zavadil, K. Žďánský, J. Lörinčík, “Influence of Yb and Yb2O3 on the Properties of InP Layers”, Proceedings of the 20th International Conference on Indium Phosphide and Related Materials, 25-29 May 2008, Versailles, France. 
            15. J. Lorincik, Z. Sroubek, “Oxygen O18 method and the search for the ionization mechanism in sputtering of oxygenated surfaces”, The 16th International Conference on Secondary Ion Mass Spectrometry, October 29 – November 2, 2007, Kanazawa, Japan. 
            16. J. Grym, O. Procházková, J. Lörinčík, J. Zavadil, K. Žďánský, “Characterization of Pr, Yb, and Ce doped InP layers by PL and SIMS”, Proceedings of the Joint Fifth International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth, 20 – 24 May 2007, Zakopane, Poland. 
            17. K. Zdansky, P. Kacerovsky, J. Zavadil, J. Lorincik, A. Fojtik, “Layers of metal nanoparticles on semiconductors deposited by electrophoresis from solutions with reverse micelles”, Proceedings of the 14th Semiconducting and Insulating Materials Conference, SIMC XIV, May 15 – 20, 2007, Arkansas, Fayetteville, USA. 
            18. J. Grym, O. Procházková, K. Žďánský, J. Zavadil, J. Lörinčík, “Impact of rare-earth elements and their oxides on growth and properties of InP LPE layers”, XXXV International School on the Physics of Semiconducting Compounds Jaszowiec 2006. June 17 – 23, 2006. 
            19. J. Toušková, J. Toušek, A. Poruba, R. Barinka, P. Hlídek, J. Lorinčík, “Influence of Silicon Nitride Layers on the Minority Carrier Diffusion Length in Silicon Wafers”, Proceedings of the 21st European Photovoltaic Solar Energy Conference, 4-8 September 2006, Dresden, Germany. 
            20. R. Zeipl, J. Navratil, L. Benes, T. Kocourek, M. Jelinek, J. Lorincik, J. Vanis, J. Zelinka, and J. Walachova, “Thin layers prepared by pulsed laser deposition from Yb0.19Co4Sb12 target”, Thermoelectrics, 2006. ICT apos;06. 25th International Conference on Thermoelectrics, Volume, Issue, 6-10, Aug. 2006, Vienna, Austria, Page(s):451 – 454, Digital Object Identifier 10.1109/ICT.2006.331312. 
            21. R. C. Sobers Jr, K. Franzreb, J. Lorincik, and P. Williams, “A Mechanistic Study of Surface Chemical Segregation During SIMS Depth Profiling Via a Recently Realized Oxygen-18 Implant Technique”, Proceedings of the 19th Rocky Mountain Regional Meeting of the ACS, October 14-18th, 2006, Tucson, Arizona. 
            22. P. Williams, K. Franzreb, J. Lorincik, R. C. Sobers Jr, “Quantitative fundamental SIMS studies using O18 implant standards”, The 15th International Conference on Secondary Ion Mass Spectrometry, September 12 – 16, 2005, Manchester, United Kingdom. 
            23. P. Williams, J. Lorincik, R. Hervig, M. Bonner Denton, Roger Sperline, and Georges Slodzian, “Isotope Ratio Measurement with a Multicollector Detector on the Cameca IMS nf”, The 15th International Conference on Secondary Ion Mass Spectrometry, September 12 – 16, 2005, Manchester, United Kingdom. 
            24. R. C. Sobers Jr, J. Hrušák, J. Lorincik, K. Franzreb, and P. Williams, “Oxygen induced segregation during SIMS depth profiling”, 19th Annual SIMS workshop proceedings, May 16 - 19, 2006, The Westin Mission Hills in Rancho Mirage, CA, USA. 
            25. J. Lorincik, R. Hervig, M. B. Denton, R. Sperline, G. Slodzian, and P. Williams, “Multiple ion detection on Cameca IMS nf”, 18th Annual SIMS workshop proceedings, May 2 – 5, 2005, Hilton Head, South Carolina, USA. 
            26. K. Franzreb, R. C. Sobers Jr, J. Lorincik, and P. Williams, “A comparison of oxygen enhancement of positive secondary ion emission from Cu, Al, and Si surfaces”, 18th Annual SIMS workshop proceedings, May 2 – 5, 2005, Hilton Head, South Carolina, USA. 
            27. P. Williams, K. Franzreb, J. Lorincik, and Z. Sroubek, “Understanding oxygen enhancement of secondary ion yields of silicon: Comparison of experimentsl results for Si+- and theoretical model”, 17th Annual SIMS workshop proceedings, May 17 – 20, 2004, Westminster, Colorado, USA. 
            28. K. Franzreb, J. Lorincik, R. C. Sobers Jr, and P. Williams, “Multiply charged molecular ions produced during sputtering”, 17th Annual SIMS workshop proceedings, May 17 – 20, 2004, Westminster, Colorado, USA. 
            29. K. Franzreb, R. C. Sobers Jr, J. Lorincik, and P. Williams, “Detection of the diatomic dications SiH2++ and AlH2++”, The 15th International Conference on Secondary Ion Mass Spectrometry, September 14 – 19, 2003, San Diego, California, USA. 
            30. J. Lorincik, K. Franzreb, and P. Williams, “SIMION modeling of ion optical effects in Cameca ion microanalysers: simulation of ion transmission losses”, The 15th International Conference on Secondary Ion Mass Spectrometry, September 14 – 19, 2003, San Diego, California, USA. 
            31. HP. Winter, F. Aumayr, J. Lorincik, and Z. Šroubek, " A close look to subthreshold kinetic emission from clean metal surfaces: Surface-assisted kinetic emission and potential excitation of plasmons”, Proc. ISI-2001 Ion Surface Interactions, p. 25, 21-31 Aug 2001, Zvenigorod, Moscow, Russia. 
            32. S. Cernusca, A. Diem, E. Galutschek, H. Eder, HP.Winter, F.Aumayr, J. Lorincik, Z.Sroubek “Kinetic electron emission from carbon surfaces induced by hydrogen ions“, ICPEAC XXII International Conference on Photonic, Electronic, and Atomic Collisions, Jun 16-24, 2001, Santa Fe, New Mexico, USA 
            33. V. Petrzílka, F. Zacek, B. Kolman, F. Kroupa, K. Jakubka, J. Stoeckel, R. Klíma, L. Krlín, P. Pavlo, J. Gunn, M. Goniche, V. Fuchs, P. Devynck, D. Tskhakaya, S. Kuhn, J. A. Tataronis, and J. Lorincik, "On the Fast Electron Beam, Consequent Generation of Electrostatic Fields and Fast Ion Production in front of LH Grills: Measurements and Theory", paper IAEA-CN-77/EXP4/07 in Proc. 18th IAEA Fusion Energy Conference, Sorrento, Italy, Oct. 4-11, 2000. 
            34. Sroubek Z. and Lorincik J., "Ion emission from CaF2:Ce bombarded by charged and neutral particles," in Proceedings of the VIII International Workshop on "Ion beam surface diagnostics", Uzghorod, Ukraine (1998) 51-52. 
            35. Gillen G., Bright D., Lorincik J., and Mogren S., "Quantitative 3D image depth profiling SIMS: Characterization of patterned ion implants in silicon," p. 321-4, in the Proceedings of the Tenth International Conference on SIMS (SIMS X), eds. A. Benninghoven, B. Hagenhoff, H.W. Werner, John Wiley & Sons, Chichester, 1997. 
            36. Hrach R., Lorincik J., Sobotka M., “On Methods of Mathematical Morphology in Spatial Analysis of Island Metal Films”, Conf. Abstr. of 4th Int. Symposium on Small Particles on Inorganic Clusters, Aix-en-Provence, 1988, France. 
            37. Lorincik J., Benes V., Suchanek Vl., "Application of Mathematical Morphology to Analysis of Electrical Conductivity of Discontinuous Metal Films," Proc. 3rd Coloquium on Applied Stereology and Image Analysis '88, High Tatras 1988, Czechoslovakia. 
            38. Lorincik J., Hrach R., Sobotka M."Influence of Electric Field on the First Stages of Thin Metal Film Growth," Proc. Intern. Conf. "Electrodynamics and Quantum Phenomena at Interfaces", Telavi 1984, USSR.

              Kontaktujte nás

              Datová schránka: m54nucy

              IČ: 67985882
              DIČ: CZ67985882

              Sledujte nás

              LinkedInFacebook