Přednášející: Ingmar Swart (Utrecht University)
Místo: Pracoviště Cukrovarnická, Přednášková místnost, Budova A, první patro
Jazyk: anglicky
Pořadatelé:
Oddělení tenkých vrstev a nanostruktur
Atomic force microscopy (AFM) finds increasing use in the field of chemistry. This development started with the demonstration of imaging the chemical structure of organic molecules with atomic resolution. Current research focusses on extracting quantitative information from AFM experiments. For example, it has recently been shown that bond-order discrimination is possible on flat molecules. However, the large majority of molecules is not flat. In addition, the flexibility of the molecule terminated tips needed for atomic resolution imaging needs to be considered. Both these effects raise questions as to what the limits of extracting quantitative information are (How accurately can we measure bond lengths?, Is it possible to visualize inter-molecular bonds?). In my presentation, I will try to answer these questions. Finally, I will talk about some of our recent work to expand the scanning probe toolkit with a functionality that is critical for applications in chemistry: the ability to chemically identify atoms in molecules.
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