Laboratory for electrical characterization of materials

Measurement of volt-amper (IV) and CV characteristics (T = 77-430K)

High Voltage Source-Measure Unit (Keithley 237 and 236);

C-V Analyzer (Keithley 237);

Temperature Controller (LakeShore 330),

Nitrogen kryostat.

 Measurement of the temperature-dependent Hall effect (T = 10-430K)

Digital Multimeter (Keithley 2000);

Temperature Controller (LakeShore 340);

Picoammeter (Keithley 486 );

Helium kryostat.

Characterization of radiation detectors

ORTEC equipment for the measurement of the detector performance consisting of the charge-sensitive preamplifier 142A;

Shaping amplifier 572A;

8k multichannel analyzer PCI Trump Card;

MAESTRO-32 emulation software.

Deep level transient spectroscopy (DLTS)

Deep Level Transient Spectroscopy (Sula Technologies) Measurement modes include: C-V, C-T, I-V, I-T, DLTS, DDLTS.

Temperature ranges: 77K to 420K.