Nanostructures characterization laboratory

Equipment:nano lab 1

  • Atomic force microscope - AFM (MultimodeTM, Veeco, USA)
  • Elipsometer (SE 850, Sentech, Germany)
  • Optical Profilometer NewView7300 (ZYGO, USA)

 

nano lab 2

Contact us

Data box: m54nucy

IČ: 67985882
DIČ: CZ67985882

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