Fyzikální ústav Akademie věd ČR

Exchange bias in UO2/Fe3O4 thin films

The exchange interaction through interface of dissimilarly ordered magnetic materials (e.g. an antiferromagnet (AF) in contact with a ferro- or ferrimagnet (F)) gives rise to a characteristic exchange bias (EB) effect [1] (i.e. shifted magnetic hysteresis loop with an enhanced coercivity), which is of fundamental importance for novel hard magnets, recording media, spin valve and tunneling devices. Having in mind the strong spin-orbit coupling and enormous magnetic anisotropy displayed by some actinide compounds, we employed uranium-based antiferromagnets to study the exchange anisotropy effects in thin magnetic films.

A series of UO2-magnetite films with a variable layers thickness was produced by reactive sputtering. A very strong effect, reaching 0.26 T in a bilayer with the thinnest Fe3O4 layer (90 Å), was found [2]. Magnetization measurements demonstrate that a remarkably large EB is present at temperatures higher than the bulk Néel temperature of UO2 (TN = 30.8 K). Our study reveals a complex nature of the effect: we suggest that it is provided both by strong exchange coupling between UO2 and Fe3O4 and by exchange biasing within magnetite (up to ~25 % of the total effect at 5 K). The former can be caused by proximity effects of Fe3O4 on TN combined with a magnetic anisotropy of UO2, persisting above a continuous magnetic-ordering transformation. For magnetite, the magnetic moments remain pinned up to 120 K that correlates with the change in the easy magnetization axis of Fe3O4 across the Verwey transition. The effects are observed in the samples of quality controlled by different methods such as ex-situ x-ray resonant scattering, conventional x-ray diffraction and transmission electron microscopy.

Fig. 1

References:
[1] W.H. Meiklejohn, C.P. Bean, Phys. Rev. B 102 (1956) 1413.
[2] E.A. Tereshina, Z. Bao, L. Havela, S. Danis, C. Kuebel, T. Gouder, R. Caciuffo, Exchange bias in UO2/Fe3O4 thin films above the Néel temperature of UO2 Appl. Phys. Lett. 105 (2014) 122405.

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