DC and AC electrophoretic deposition of nanoparticles.
Measurement of current-voltage (I-V) and capacitance-voltage (C-V) characteristics, Hall effect measurements, characterization of radiation detectors, DLTS.
Characterization of surfaces by scanning electron microscopy, energy dispersive X-ray spectroscopy, cathodoluminescence and secondary ion mass spectrometry FIB TOF SIMS.
Investigation of the electronic structure of semiconductor materials and structures, measurement of photoluminescence spectrum.
Raman spectroscopy and optical spectroscopy.