Dr. Ladislav Fekete, Mgr. Martin Golan
Dimension Icon - ambient AFM microscope - Bruker company , measuring in PeakForce mode providing quantitative or contrast information of Young modulus, adhesion, dissipation and deformation in addition to standard topography (up to 8 channels with 5120 x 5120 points can be measured simultaneously). In the PeakForce mode the tip is oscillating at 2 kHz and the electronics is fast enough to measure in each point force curves from which the nanomechanical properties of the samples can be established.
- Lateral Force Microscopy (LFM)
- Force Modulation Microscopy
- Magnetic Force Microscopy (MFM)
- Electric Force Microscopy (EFM)
- Surface Potential Microscopy (KPM)
- Phase Imaging
- Force Volume
- Electrochemical STM & AFM (ECM)
- Scanning Capacitance Microscopy (SCM)
- Scanning Spreading Resistance (SSRM)
- Tunneling AFM (TUNA)
- Conductive AFM (CAFM)
- Nanoindentation, Nanolithography, Nanomanipulation
- Torsional Resonance Mode (TR Mode)
In addition, our AFM is equipped with electro-chemistry cell which can be heated up to 70 C with tip holders designed for measurements in liquids and an additional heating stage where the temperature can be set between -35C and 250C.
The maximum measured are is 90 x 90 mirometer^2 in X-Y direction and 10 microns in the Z direction. The noise level is 35pm and the stability (thermal drift) of the system is on a scale of 200 pm /min. The samples can be placed on a motorized stage with 180 mm × 150 mm possibility of movement and the whole microscope is placed in anti-acoustic noise box.
Reservation
Dr. Fekete: fekete
fzu [dot] cz
