Atomic Force Microscopy

Dr. Ladislav Fekete, Mgr. Martin Golan

Dimension Icon - ambient AFM microscope - Bruker company , measuring in PeakForce mode providing quantitative or contrast information of Young modulus, adhesion, dissipation and deformation in addition to standard topography (up to 8 channels with 5120 x 5120 points can be measured simultaneously). In the PeakForce mode the tip is oscillating at 2 kHz and the electronics is fast enough to measure in each point force curves from which the nanomechanical properties of the samples can be established.

• Lateral Force Microscopy (LFM)
• Force Modulation Microscopy
• Magnetic Force Microscopy (MFM)
• Electric Force Microscopy (EFM)
• Surface Potential Microscopy (KPM)
• Phase Imaging
• Force Volume
• Electrochemical STM & AFM (ECM)
• Scanning Capacitance Microscopy (SCM)
• Scanning Spreading Resistance (SSRM)
• Tunneling AFM (TUNA)
• Conductive AFM (CAFM)
• Nanoindentation, Nanolithography, Nanomanipulation
• Torsional Resonance Mode (TR Mode)

In addition, our AFM is equipped with electro-chemistry cell which can be heated up to 70 C with tip holders designed for measurements in liquids and an additional heating stage where the temperature can be set between -35C and 250C.

The maximum measured are is 90 x 90 mirometer^2 in X-Y direction and 10 microns in the Z direction. The noise level is 35pm and the stability (thermal drift) of the system is on a scale of 200 pm /min. The samples can be placed on a motorized stage with 180 mm × 150 mm possibility of movement and the whole microscope is placed in anti-acoustic noise box.

Reservation Dr. Fekete: feketefzu [dot] cz