Over that past 10 years, my coworkers and I developed a new versatile tool to study magnetic phenomena with atomic resolution, i.e., magnetic exchange force microscopy (MExFM) [1]. In contrast to magnetic force microscopy (MFM), which probes the long-range dipolar magnetostatic interaction, it is sensitive to the electron-mediated short-range magnetic exchange interaction between neighboring spins [2]. As a force microscopy based technique, it can - unlike spin-polarized scanning tunneling microscopy (SP-STM) - also be applied to nonconductive surfaces.
In my presentation, I will...
