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Measuring of individual grains in micro-crystalline silicon

  1. left image: topography of grains measured by ambient atomic force microscopy (AFM)
  2. right image: simultaneously measured map of local conductivity.
We are measuring the current flowing from the AFM tip through the sample to the bottom electrode.
T. Mates et al., J. Non-Crystalline Solids, 352 (2006) 1011