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Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS): A Success Story for All Kind of Applications in Surface and Interface Analysis

Seminar
Monday, 07.12.2015 13:00 to 14:00

Speakers: Markus Terhorst (ION-TOF GmbH, Münster, Germany)
Place: Library of the Institute of Physics CAS, Cukrovarnicka 10, Praha 6
Presented in English
Organisers: Department of Optical Materials
Přílohy: 
PDF icon Abstract