Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS): A Success Story for All Kind of Applications in Surface and Interface Analysis
Seminar
Monday, 07.12.2015 13:00 to 14:00
Speakers: Markus Terhorst (ION-TOF GmbH, Münster, Germany) Place: Library of the Institute of Physics CAS, Cukrovarnicka 10, Praha 6 Presented in English Organisers:Department of Optical Materials