- e-beam pattern generator Tesla BS600 developed by ISI in 1977-1987;
continuously modernized until now;
- procedures for adjusting the pattern generator;
- technological and lithographic marks; testing patterns;
- apertures forming a rectangular beam;
- current density distribution in the beam;
- electron emitters.
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E-Beam Lithography Group (EBL)
Research Areas:
Offered Technologies:
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E-beam pattern generator Tesla BS600
- E-beam pattern generator with rectangularly shaped beam and electron energy of 15 keV.
- Recording resolution (beam positioning) of 50 nm.
- Beam size adjustable from 50 to 6300 nm (standard mode); from 17 to 2100 nm (TZ mode).
- Exposure field 3 × 3 mm2 (max).
- Proximity effect corection algorithmes.
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Comparative study: four methods for measurements of the beam current density. |
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Electron emitter tip (left); emission pattern (midle); tip model crystalography (right). |
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