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Group of the transport properties of semiconductors

  1. Research activities of the group
  2. Equipment and experimental methods available

Research activities of the group involve prevailingly

  • Measurement of magnetotransport in semiconductor structures with lowered dimension at low temperatures
  • Experimental study of bound electron states due to defects in semiconductors.

The following equipment and experimental methods are available
  • Equipment for magnetotransport measurements at low temperatures (0.3 K), Oxford Instruments superconducting magnet up to 8 Tesla, Oxford Instruments AVS-47 ultralow excitation resistance bridge.
  • Resistivity measurements in the range between 10-4 W and 1014 W , current measurements between 10-14 Ω and 10 Ω in the temperature range between 0.3 K and 400 K.
  • Frequency dependence of complex impedance in the range from 5 Hz to 13 MHz and with a sensitivity ranging from aF to mF for the imaginary part and from 10-16 S to 10-4 S for the real part of the impedance, Hewlett-Packard 4192A - low frequency analyser, GR 1616 capacitance system.
  • Measurements of current-voltage curves and capacitance-voltage characteristics at temperatures between 1.2 K and 350 K and in the computer controlled modes. The equipments include a mercury probe .
  • Deep Level Transient Spectroscopy (DLTS) operating at 1MHz with the sensitivity ND/NS = 10-7 (ND and NS being the concentrations of deep and shallow impurities, respectively) over the temperature range between 4.2 K and 400 K with the possibility of using also the frequency scan. Photoinduced Current Transient Spectroscopy (PICTS) with a semiconductor laser excitation in the temperature range from 77 K to 450 K with a current resolution of the order of 1 pA and time resolution below 1 µs.
  • Edwards Auto 500 Vacuum Coating System including 4-position electron gun, resistive evaporator, RF sputtering source and vacuum furnace provides a complete vacuum solution for the coating various substrates with both metals and non-metals providing a high level of control (thickness monitors, mass spectrometer).

The group has a considerable experience in the work with the techniques mentioned above on a good international level.