With emerging of new microscopic techniques and their widespread use, appropriate sample preparation is still the crucial prerequisite for successful microstructural observation of bulk metallic samples. This involves the preparation of parallel planes with mirror-like surface or defined sample thickness reduction without damaging of surface layer for special applications. In order to demonstrate state-of-the-art development in this field, we organize a workshop in cooperation with Struers GmbH Praha and Carl Zeiss spol. s r. o.
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