AFM based characterization of inorganic and organic semiconductor nanostructures
Seminar
Thursday, 13.10.2011 14:00 to 16:00
Speakers: Christian Teichert (Montan University, Leoben, Austria) Place: Cukrovarnicka 10, library, block A, 1st fl. Presented in English Organisers:Department of Thin Films and Nanostructures