Dimension Icon - ambient AFM microscope - Bruker company , measuring in PeakForce mode providing quantitative or contrast information of Young modulus, adhesion, dissipation and deformation in addition to standard topography (up to 8 channels with 5120 x 5120 points can be measured simultaneously). In the PeakForce mode the tip is oscillating at 2 kHz and the electronics is fast enough to measure in each point force curves from which the nanomechanical properties of the samples can be established.
In addition, our AFM is equipped with electro-chemistry cell which can be heated up to 70 C with tip holders designed for measurements in liquids and an additional heating stage where the temperature can be set between -35C and 250C.
The maximum measured are is 90 x 90 mirometer^2 in X-Y direction and 10 microns in the Z direction. The noise level is 35pm and the stability (thermal drift) of the system is on a scale of 200 pm /min. The samples can be placed on a motorized stage with 180 mm × 150 mm possibility of movement and the whole microscope is placed in anti-acoustic noise box.