Publications - Microscopy and Spectroscopy of Surfaces

 Journal Article

2018

Walker, Christopher, Konvalina, Ivo, Mika, Filip, Frank, Luděk, Müllerová, Ilona. Quantitative comparison of simulated and measured signals in the STEM mode of a SEM. Nuclear Instruments & Methods in Physics Research Section B.  2018, vol. 415, pp. 17-24. ISSN 0168-583X. ABSTRACT

2017

Fragal, E.H.; Fragal, V.H.; Huang, X.; Martins, A.C.; Cellet, T.S.P.; Pereira, G.M.; Mikmeková, Eliška; Rubira, A.F.; Silva, R.; Asefa, T. From ionic liquid-modified cellulose nanowhiskers to highly active metal-free nanostructured carbon catalysts for the hydrazine oxidation reaction. Journal of materials chemistry A 2017, vol. 5, iss. 3, pp. 1066-1077. ISSN 2050-7488. ABSTRACT

Frank, Luděk; Mikmeková, Eliška; Lejeune, M. Treatment of surfaces with low-energy electrons. Applied Surface Science 2017, vol. 407, JUN 15, pp. 105-108. ISSN 0169-4332. ABSTRACT

Knápek, Alexandr; Sobola, D.; Tománek, P.; Pokorná, Zuzana; Urbánek, Michal. Field emission from the surface of highly ordered pyrolytic graphite. Applied Surface Science 2017, vol. iss. 395, FEB 15, pp. 157-161. ISSN 0169-4332. ABSTRACT

Knápek, Alexandr; Sýkora, Jiří; Chlumská, Jana; Sobola, D. Programmable set-up for electrochemical preparation of STM tips and ultra-sharp field emission cathodes. Microelectronic Engineering 2017, vol. 173, APR 5, pp. 42-47. ISSN 0167-9317. ABSTRACT

Paruzel, Bartosz; Pavlova, Ewa; Pfleger, Jiří; Šlouf, Miroslav; Halašová, Klára; Mikmeková, Šárka. Poly(3-hexylthiophene)/gold nanoparticle nanocomposites: relationship between morphology and electrical conductivity. Chemical Papers 2017, vol. 71, iss. 2, pp. 401-408. ISSN 0366-6352. ABSTRACT

Piňos, Jakub; Mikmeková, Šárka; Frank, Luděk. About the information depth of backscattered electron imaging. Journal of Microscopy 2017, vol. 266, iss. 3, pp. 335-342. ISSN 0022-2720. ABSTRACT

Schäfer, J.; Fricke, K.; Mika, Filip; Pokorná, Zuzana; Zajíčková, L.; Foest, R. Liquid assisted plasma enhanced chemical vapour deposition with a non-thermal plasma jet at atmospheric pressure. Thin Solid Films 2017, vol. 630, MAY 30, pp. 71-78. ISSN 0040-6090. ABSTRACT

Zeng, Y.P.; Liu, Z.W.; Mikmeková, Eliška. Magnetoresistance effects associated with various electric conduction mechanisms in nanostructured [C/FeCo]n multilayers. Journal of Magnetism and Magnetic Materials 2017, vol. 421, January, pp. 39-43. ISSN 0304-8853. ABSTRACT

2016

Dolina, J.; Dvořák, L.; Lederer, T.; Vacková, Taťana; Mikmeková, Šárka; Šlouf, Miroslav; Černík, M. Characterisation of morphological, antimicrobial and leaching properties of in situ prepared polyurethane nanofibres doped with silver behenate. RSC Advances. 2016, vol. 6, iss. 28, pp. 23816-23826. ISSN 2046-2069. ABSTRACT

Mikmeková, Eliška; Frank, Luděk; Müllerová, Ilona; Li, B. W.; Ruoff, R. S.; Lejeune, M. Study of multi-layered graphene by ultra-low energy SEM/STEM. Diamond and Related Materials. 2016, vol. 63, March, pp. 136-142. ISSN 0925-9635. ABSTRACT

Müllerová, Ilona; Mikmeková, Eliška; Mikmeková, Šárka; Konvalina, Ivo; Frank, Luděk. Practical Use of Scanning Low Energy Electron Microscope (SLEEM). Microscopy and Microanalysis. 2016, vol. 22, S3, pp. 1650-1651. ISSN 1431-9276. ABSTRACT

Nebesářová, Jana; Hozák, Pavel; Frank, Luděk; Štěpan, P.; Vancová, Marie. The Cutting of Ultrathin Sections With the Thickness Less Than 20 nm From Biological Specimens Embedded in Resin Blocks. Microscopy Research Technique. 2016, vol. 79, iss. 6, pp. 512-517. ISSN 1059-910X. ABSTRACT

Prysiazhnyi, V.; Slavíček, P.; Mikmeková, Eliška; Klíma, M. Influence of Chemical Precleaning on the Plasma Treatment Efficiency of Aluminum by RF Plasma Pencil. Plasma Science & Technology. 2016, vol. 18, iss. 4, pp. 430-437. ISSN 1009-0630. ABSTRACT

Walker, C.; Frank, Luděk; Müllerová, Ilona. Simulations and measurements in scanning electron microscopes at low electron energy. Scanning 2016, vol. 38, iss. 6, pp. 802-818. ISSN 0161-0457. ABSTRACT

2015

Brzobohatý, Oto; Šiler, Martin; Trojek, Jan; Chvátal, Lukáš; Karásek, Vítězslav; Paták, Aleš; Pokorná, Zuzana; Mika, Filip; Zemánek, Pavel. Three-Dimensional Optical Trapping of a Plasmonic Nanoparticle using Low Numerical Aperture Optical Tweezers. Scientific Reports. 2015, vol. 5, JAN, 08106:1-9. ISSN 2045-2322. ABSTRACT

Frank, Luděk; Mikmeková, Eliška; Müllerová, Ilona; Lejeune, M. Counting graphene layers with very slow electrons. Applied Physics Letters. 2015, vol. 106, JAN, 013117:1-5. ISSN 0003-6951. ABSTRACT

Frank, Luděk; Nebesářová, Jana; Vancová, Marie; Paták, Aleš; Müllerová, Ilona. Imaging of tissue sections with very slow electrons. Ultramicroscopy. 2015, vol. 148, JAN, pp. 146-150. ISSN 0304-3991. ABSTRACT

Frank, Luděk; Mika, Filip; Müllerová, Ilona. Optimizing the Recognition of Surface Crystallography. Microscopy and Microanalysis. 2015, vol. 21, S4, pp. 124-129. ISSN 1431-9276. ABSTRACT

Huang, X.; Zou, X.; Meng, Y.; Mikmeková, Eliška; Chen, H.; Voiry, D.; Goswami, A.; Chhowalla, M.; Asefa, T. Yeast Cells-Derived Hollow Core/Shell Heteroatom-Doped Carbon Microparticles for Sustainable Electrocatalysis. ACS Applied Materials and Interfaces. 2015, vol. 7, iss. 3, pp. 1978-1986. ISSN 1944-8244. ABSTRACT

Knápek, Alexandr; Pokorná, Zuzana. A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs. Ultramicroscopy. 2015, vol. 148, JAN, pp. 52-56. ISSN 0304-3991. ABSTRACT

Knápek, Alexandr; Radlička, Tomáš; Krátký, Stanislav. Simulation and Optimization of a Carbon Nanotube Electron Source. Microscopy and Microanalysis. 2015, vol. 21, iss. S4, pp. 60-65. ISSN 1431-9276. ABSTRACT

Mika, Filip; Walker, Christopher; Konvalina, Ivo; Müllerová, Ilona. Imaging with STEM Detector, Experiments vs. Simulation. Microscopy and Microanalysis. 2015, vol. 21, iss. S4, pp. 66-71. ISSN 1431-9276. ABSTRACT

Müllerová, Ilona; Mikmeková, Eliška; Frank, Luděk. Examination of Graphene in a Scanning Low Energy Electron Microscope. Microscopy and Microanalysis. 2015, vol. 21, iss. S3, pp. 29-30. ISSN 1431-9276. ABSTRACT

Neděla, Vilém; Konvalina, Ivo; Oral, Martin; Hudec, Jiří. Monte Carlo Simulations of Signal Electrons Collection Efficiency and Development of New Detectors for ESEM. Microscopy and Microanalysis. 2015, vol. 21, iss. S3, pp. 1109-1110. ISSN 1431-9276.

Neděla, Vilém; Konvalina, Ivo; Oral, Martin; Hudec, Jiří. The Simulation of Energy Distribution of Electrons Detected by Segmental Ionization Detector in High Pressure Conditions of ESEM. Microscopy and Microanalysis. 2015, vol. 21, iss. S4, s. 264-269. ISSN 1431-9276. ABSTRACT

2014

 Al-Sharab, J. F.; Mikmeková, Eliška; Das, S.; Goswami, A.; El-Sheikh, S. M.; Ismail, A. A.; Hesari, M.; Maran, F.; Asefa, T. Low Energy TEM Characterizations of Ordered Mesoporous Silica-Based Nanocomposite Materials for Catalytic Applications. Microscopy and Microanalysis, 2014, vol. 20, S3, pp. 1900-1901. ISSN 1431-9276. ABSTRACT

Das, S.; Goswami, A.; Hesari, M.; Al-Sharab, J. F.; Mikmeková, Eliška; Maran, F.; Asefa, T. Reductive Deprotection of Monolayer Protected Nanoclusters: An Efficient Route to Supported Ultrasmall Au Nanocatalysts for Selective Oxidation. Small, 2014, vol. 10, č. 8, s. 1473-1478. ISSN 1613-6810. ABSTRACT

Müllerová, Ilona; Mikmeková, Šárka; Mikmeková, Eliška; Pokorná, Zuzana; Frank, Luděk. Exploitation of Contrasts in Low Energy SEM to Reveal True Microstructure. Microscopy and Microanalysis, 2014, roč. 20, S3, s. 858-859. ISSN 1431-9276. ABSTRACT

Zou, X.; Huang, X.; Goswami, A.; Silva, R.; Sathe, B. R.; Mikmeková, Eliška; Asefa, T. Cobalt-Embedded Nitrogen-Rich Carbon Nanotubes Efficiently Catalyze Hydrogen Evolution Reaction at All pH Values. Angewandte Chemie - International Edition 2014, roč. 53, č. 17, s. 4372-4376. ISSN 1433-7851. ABSTRACT

2013

Frank, Luděk; Mikmeková, Šárka; Pokorná, Zuzana; Müllerová, Ilona. Scanning Electron Microscopy With Slow Electrons. Microscopy and Microanalysis. 2013, vol. 19, iss. S2, pp. 372-373. ISSN 1431-9276. ABSTRACT

Ma, H.L.; Liu, Z.W.; Zeng, D.C.; Zhong, M.L.; Yu, H.Y.; Mikmeková, Eliška. Nanostructured ZnO films with various morphologies prepared by ultrasonic spray pyrolysis and its growing process. Applied Surface Science. 2013, vol. 283, 15 October, pp. 1006-1011. ISSN 0169-4332.  ABSTRACT

Mikmeková, Eliška; Polčák, J.; Sobota, Jaroslav; Müllerová, Ilona; Peřina, Vratislav; Caha, O. Humidity resistant hydrogenated carbon nitride films. Applied Surface Science. 2013, vol. 275, 15 June, pp. 7-13. ISSN 0169-4332. ABSTRACT

Mikmeková, Eliška; Bouyanfif, H.; Lejeune, M.; Müllerová, Ilona; Hovorka, Miloš; Unčovský, M.; Frank, Luděk. Very low energy electron microscopy of graphene flakes. Journal of Microscopy. 2013, vol. 251, iss. 2, pp. 123-127. ISSN 0022-2720. ABSTRACT

Mikmeková, Šárka; Mašek, B.; Jirková, H.; Aišman, D.; Müllerová, Ilona; Frank, Luděk. Microstructure of X210Cr12 steel after the forming in semi-solid state visualized by very low energy SEM in ultra high vacuum. Applied Surface Science. 2013, vol. 275, 15 June, pp. 403-408. ISSN 0169-4332. ABSTRACT

Mikmeková, Šárka; Yamada, K.; Noro, H. TRIP steel microstructure visualized by slow and very slow electrons. Microscopy. 2013, vol. 62, iss. 6, pp. 589-596. ISSN 2050-5698. ABSTRACT

Müllerová, Ilona; Mikmeková, Eliška; Konvalina, Ivo; Frank, Luděk. Low energy Scanning Transmission Electron Microscope. Microscopy and Microanalysis. 2013, Roč. 19, iss. S2, pp. 1236-1237. ISSN 1431-9276.

2012

 Frank, Luděk; Hovorka, Miloš; Mikmeková, Šárka; Mikmeková, Eliška; Müllerová, Ilona; Pokorná, Zuzana. Scanning Electron Microscopy with Samples in an Electric Field. Materials, 2012, vol. 5, iss. 12, pp. 2731-2756. ISSN 1996-1944. ABSTRACT

Mika, Filip; Paták, Aleš; Frank, Luděk. Rastrovací elektronový mikroskop s rozlišením pod 1 nm. Jemná mechanika a optika. 2012, roč. 57, č. 10, s. 281-282. ISSN 0447-6441.

Müllerová, Ilona; Hovorka, Miloš; Frank, Luděk. A method of imaging ultrathin foils with very low energy electrons. Ultramicroscopy. 2012, vol. 119, AUG, pp. 79-81. ISSN 0304-3991. ABSTRACT

Müllerová, Ilona; Mikmeková, Eliška; Mikmeková, Šárka; Hovorka, Miloš; Frank, Luděk. Applications of the Scanning Low Energy Electron Microscope. Microscopy and Microanalysis. 2012, vol. 18, iss. S2, pp. 996-997. ISSN 1431-9276. ABSTRACT

Müllerová, Ilona; Pokorná, Zuzana; Frank, Luděk; Mikmeková, Šárka; Mikmeková, Eliška. Elektronová mikroskopie v Ústavu přístrojové techniky AV ČR. Jemná mechanika a optika. 2012, roč. 57, č. 10, s. 265-269. ISSN 0447-6441.

Müllerová, Ilona; Hovorka, Miloš; Mika, Filip; Mikmeková, Eliška; Mikmeková, Šárka; Pokorná, Zuzana; Frank, Luděk. Very low energy scanning electron microscopy in nanotechnology. International Journal of Nanotechnology. 2012, vol. 9, iss. 8/9, pp. 695-716. ISSN 1475-7435. ABSTRACT

Pokorná, Zuzana; Mikmeková, Šárka; Müllerová, Ilona; Frank, Luděk. Characterization of the local crystallinity via reflectance of very slow electrons. Applied Physics Letters 2012, vol. 100, iss. 26, 261602:1-4. ISSN 0003-6951. ABSTRACT
 

2011

Frank, Luděk; Hovorka, Miloš; Konvalina, Ivo; Mikmeková, Šárka; Müllerová, Ilona. Very low energy scanning electron microscopy. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 645, iss. 1, pp. 46-54. ISSN 0168-9002. ABSTRACT

Konvalina, Ivo; Müllerová, Ilona. Properties of the cathode lens combined with a focusing magnetic/immersion-magnetic lens. Nuclear Instruments & Methods in Physics Research Section A 2011, roč. 645, č. 1, s. 55-59. ISSN 0168-9002. ABSTRACT

Mikmeková, Šárka; Matsuda, K.; Watanabe, K.; Ikeno, S.; Müllerová, Ilona; Frank, Luděk. FIB Induced Damage Examined with the Low Energy SEM. Materials Transactions. 2011, vol. 52, iss. 3, pp. 292-296. ISSN 1345-9678. ABSTRACT

Müllerová, Ilona; Hovorka, Miloš; Konvalina, Ivo; Unčovský, M.; Frank, Luděk. Scanning transmission low-energy electron microscopy. IBM Journal of Research and Development. 2011, vol. 55, iss. 4, 2:1-6. ISSN 0018-8646. ABSTRACT

Müllerová, Ilona; Mikmeková, Šárka; Hovorka, Miloš; Frank, Luděk. Unconventional Imaging with Backscattered Electrons. Microscopy and Microanalysis. 2011, vol. 17, Suppl. 2, pp. 900-901. ISSN 1431-9276. ABSTRACT

Neděla, Vilém; Konvalina, Ivo; Lencová, Bohumila; Zlámal, J. Comparison of calculated, simulated and measured signal amplification in variable pressure SEM. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 645, iss. 1, pp. 79-83. ISSN 0168-9002. ABSTRACT

Neděla, Vilém; Konvalina, Ivo; Lencová, B.; Zlámal, J. Simulation of Energy Selective signal Amplification in Gas Environment of Variable Pressure SEM. Microscopy and Microanalysis. 2011, vol. 17, Suppl. 2, pp. 920-921. ISSN 1431-9276. ABSTRACT

2010

Holá, M.; Mikuška, Pavel; Hanzlíková, Renáta; Kaiser, J.; Kanický, V. Tungsten carbide precursors as an example for influence of a binder on the particle formation in the nanosecond laser ablation of powdered materials. Talanta. 2010, vol. 80, iss. 5, pp. 1862-1867. ISSN 0039-9140. ABSTRACT

Hovorka, Miloš; Mika, Filip; Mikulík, P.; Frank, Luděk. Profiling N-Type Dopants in Silicon. Materials Transactions. 2010, vol. 51, iss. 2, pp. 237-242. ISSN 1345-9678. ABSTRACT

Mikmeková, Šárka; Hovorka, Miloš; Müllerová, Ilona; Man, O.; Pantělejev, L.; Frank, Luděk. Grain Contrast Imaging in UHV SLEEM. Materials Transactions. 2010, vol. 51, iss. 2, pp. 292-296. ISSN 1345-9678. ABSTRACT

Müllerová, Ilona; Hovorka, Miloš; Hanzlíková, Renáta; Frank, Luděk. Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films. Materials Transactions. 2010, vol. 51, iss. 2, pp. 265-270. ISSN 1345-9678. ABSTRACT

Pokorná, Zuzana; Frank, Luděk. Mapping the Local Density of States by Very-Low-Energy Scanning Electron Microscope. Materials Transactions. 2010, vol. 51, iss. 2, pp. 214-218. ISSN 1345-9678. ABSTRACT

Zajíčková, L.; Jašek, O.; Eliáš, M.; Synek, P.; Lazar, L.; Schneeweiss, Oldřich; Hanzlíková, Renáta. Synhesis of carbon nanotubes by plasma-enhanced chemical vapor deposition in an atmospheric-pressure microwave torch. Pure and Applied Chemistry. 2010, vol. 82, iss. 6, pp. 1259-1272. ISSN 0033-4545 ABSTRACT

Proceedings Paper - International Conference

2018

Daniel, Benjamin, Radlička, Tomáš, Piňos, Jakub, Mikmeková, Šárka, Konvalina, Ivo, Frank, Luděk, Müllerová, Ilona. Very low energy electron transmission spectromicroscopy. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 14-15. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Konvalina, Ivo, Paták, Aleš, Mikmeková, Eliška, Mika, Filip, Müllerová, Ilona. STEM modes in SEM. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 40-41. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Mika, Filip, Pokorná, Zuzana, Konvalina, Ivo, Khursheed, A. Possibilites of a secondary electrons bandpass filter for standard SEM. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Piňos, Jakub, Frank, Luděk. Real time observation of strain in the SEM sample. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 58-59. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Průcha, Lukáš, Daniel, Benjamin, Piňos, Jakub, Mikmeková, Eliška. Thermal desorption spectroscopy in prototype furnace for chemical vapor deposition. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 60-61. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Řiháček, Tomáš, Horák, M., Schachinger, T., Matějka, Milan, Mika, Filip, Müllerová, Ilona. Creation of electron vortex beams using the holographic reconstruction method in a scanning electron microscope. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 66-67. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Zouhar, Martin, Radlička, Tomáš, Oral, Martin, Konvalina, Ivo. Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 86-87. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

2017

Knápek, Alexandr, Horáček, Miroslav, Hrubý, František, Šikula, J., Kuparowitz, T., Sobola, D. Noise behaviour of field emission cathode based on lead pencil graphite. In: 30th International Vacuum Nanoelectronics Conference (IVNC).  Piscataway: IEEE, 2017, s. 274-275. ISBN 978-1-5090-3975-3. E-ISSN 2380-6311. [International Vacuum Nanoelectronics Conference /30./ (IVNC), Regensburg, 10.07.2017-14.07.2017, DE].

Konvalina, Ivo, Paták, Aleš, Mika, Filip, Müllerová, Ilona. STEM modes in SEM – simulations and experiments. In: Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A. ed. 13th Multinational Congress on Microscopy: Book of Abstracts.  Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017, s. 140-141. ISBN 978-953-7941-19-2. [Multinational Congress on Microscopy /13./, Rovinj, 24.09.2017-29.09.2017, HR].

Matějka, Milan, Krátký, Stanislav, Řiháček, Tomáš, Kolařík, Vladimír, Chlumská, Jana, Urbánek, Michal. Nanopatterning of Silicon Nitride Membranes. In: NANOCON 2016. 8th International Conference on Nanomaterials - Research and Application. Conference Proceedings.  Ostrava: Tanger, 2017, s. 709-714. ISBN 978-80-87294-71-0. [NANOCON 2016. International Conference on Nanomaterials - Research and Application /8./, Brno, 19.10.2016-21.10.2016, CZ].

Mikmeková, Eliška, Frank, Luděk, Polčák, J., Paták, Aleš, Lejeune, M. Examination of 2D crystals in a low voltage SEM/STEM. In: Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A. ed. 13th Multinational Congress on Microscopy: Book of Abstracts.  Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017, s. 618-619. ISBN 978-953-7941-19-2. [Multinational Congress on Microscopy /13./, Rovinj, 24.09.2017-29.09.2017, HR].

2016

Daniel, Benjamin; Radlička, Tomáš; Piňos, Jakub; Frank, Luděk; Müllerová, Ilona. Very low energy STEM/TOF system. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 6-7. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Frank, Luděk; Mikmeková, Eliška. Treatment of surfaces with slow electrons. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 10-11. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Knápek, Alexandr; Pokorná, Zuzana. Field emission from the surface of highly ordered pyrolytic graphite. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 22-23. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Konvalina, Ivo; Mika, Filip; Krátký, Stanislav; Müllerová, Ilona. Bandpass filter for secondary electrons in SEM - simulations. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 28-29. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Mika, Filip; Konvalina, Ivo; Krátký, Stanislav; Müllerová, Ilona. Bandpass filter for secondary electrons in SEM - experiments. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 36-37. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Müllerová, Ilona; Mikmeková, Eliška; Mikmeková, Šárka; Pokorná, Zuzana; Frank, Luděk. Reflected and transmitted mode in the scanning low energy electron microscope. In 2nd Forum of Center for ADvanced Materials Research and International Collaboration (CAMRIC-FORUM2). Toyama: University of Toyama, 2016, S. 29-30. [Forum of Center for ADvanced Materials Research and International Collaboration /2./ (CAMRIC-FORUM2), Toyama, 13.10.2016-14.10.2016, JP].

Müllerová, Ilona; Mikmeková, Eliška; Konvalina, Ivo; Frank, Luděk. Scanning transmission microscopy at very low energies. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 40-41. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Piňos, Jakub; Mikmeková, Šárka; Frank, Luděk. The information depth of backscattered electron imaging. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 46-47. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Pokorná, Zuzana; Knápek, Alexandr. Scanning very low energy electron microscopy for the characterization of polycrystalline metal samples. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 48-49. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Řiháček, Tomáš; Mika, Filip; Matějka, Milan; Krátký, Stanislav; Müllerová, Ilona. Difraction in a scanning electron microscopie. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 56-57. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Šikula, J.; Grmela, L.; Bartlová, M.; Kuparowitz, T.; Knápek, Alexandr; Mika, Filip. Noise of Low-Energy Electron Beam. In 2015 International Conference on Noise and Fluctuations (ICNF) (Proceedings IEEE). Piscataway: IEEE, 2016. ISBN 978-1-4673-8335-6. [International Conference on Noise and Fluctuations (ICNF) /23./, Xi’an, 02.06.2015-06.06.2015, CN].

Šiler, Martin; Brzobohatý, Oto; Chvátal, Lukáš; Karásek, Vítězslav; Paták, Aleš; Pokorná, Zuzana; Mika, Filip; Zemánek, Pavel. Golden nanoparticle in optical tweezers: influence of shape and orientation on optical trapping. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 64-65. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

2015

Frank, Luděk; Mikmeková, Eliška. Graphene examined with very slow electrons. In 12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, S. 182-183. ISBN 978-963-05-9653-4. [MCM 2015. Multinational Congress on Microscopy /12./, Eger, 23.08.2015-28.08.2015, HU].

Konvalina, Ivo; Mika, Filip; Müllerová, Ilona; Krátký, Stanislav. Band-pass-filter for secondary electrons in ultra-high resolution SEM. In MC 2015. Microscopy Conference Proceedings. Göttingen: DGE, 2015, S. 378-379. [Microscopy Conference 2015, Göttingen, 06.09.2015-11.09.2015, DE].

Pokorná, Zuzana; Frank, Luděk; Knápek, Alexandr; Konvalina, Ivo; Mikmeková, Eliška; Mikmeková, Šárka; Walker, Christopher; Müllerová, Ilona. Scanning low-and very low energy electron microscopy. In 12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, S. 218-220. ISBN 978-963-05-9653-4. [MCM 2015. Multinational Congress on Microscopy /12./, Eger, 23.08.2015-28.08.2015, HU].

Řiháček, Tomáš; Mika, Filip; Matějka, Milan; Krátký, Stanislav; Müllerová, Ilona. Study of the coherence of the primary beam in the low energy scanning electron microscope. In MC 2015. Microscopy Conference Proceedings. Göttingen: DGE, 2015, S. 611-612. [Microscopy Conference 2015, Göttingen, 06.09.2015-11.09.2015, DE].

2014

Frank, Luděk; Nebesářová, J.; Müllerová, Ilona. Ultra-low-energy STEM in SEM. In 18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7. [International Microscopy Congres /18./, Praha, 07.09.2014-12.09.2014, CZ].

Frank, Luděk; Konvalina, Ivo; Mikmeková, Šárka. Scanning Electron Microscopy with biased samples. In EM2014. 15th International Conference on Electron Microscopy. Kraków: Wydawnictwo Naukove Akapit, 2014, S. 76-77. ISBN 978-83-63663-48-3. [EM 2014. International Conference on Electron Microscopy /15./, Kraków, 15.09.2014-18.09.2014, PL].

Knápek, Alexandr; Mika, Filip; Prášek, J.; Majzlíková, P. SEM characterization of carbon nanotubes based active layers of chemical sensors. In Proceedings of the ISSE 2014. 37th International Spring Seminar on Electronics Technology. Piscataway: IEEE, 2014, S. 361-364. ISBN 978-1-4799-4455-2. [International Spring Seminar on Electronics Technology /37./, Dresden, 07.05.2014-11.05.2014, DE].

Lalinský, Ondřej; Bok, Jan; Schauer, Petr; Frank, Luděk. Performance of YAG:Ce Scintillators for Low-Energy Electron Detectors in S(T)EM. In 18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7. [International Microscopy Congres /18./, Praha, 07.09.2014-12.09.2014, CZ].

Mikmeková, Eliška; Frank, Luděk. Examination of Graphene with Very Slow Electrons. In NANOCON 2014. 6th International conference proceedings. Ostrava: TANGER, 2014. ISBN 978-80-87294-55-0. [NANOCON 2014. International Conference /6./, Brno, 05.11.2014-07.11.2014, CZ].

Müllerová, Ilona. History of Electron Microscopy at the Institute of Scientific Instruments. In Workshop of Interesting Topics of SEM and ESEM. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014, S. 9-10. ISBN 978-80-87441-12-1. [Workshop of Interesting Topics of SEM and ESEM, Mikulov, 26.08.2014-31.08.2014, CZ].

Müllerová, Ilona; Radlička, Tomáš; Mika, Filip; Krzyžánek, Vladislav; Neděla, Vilém; Sobota, Jaroslav; Zobač, Martin; Kolařík, Vladimír; Starčuk jr., Zenon; Srnka, Aleš; Jurák, Pavel; Zemánek, Pavel; Číp, Ondřej; Lazar, Josef; Mrňa, Libor. Main Activites of the Institute of Scientific Instruments. In Workshop of Interesting Topics of SEM and ESEM. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014, S. 7-8. ISBN 978-80-87441-12-1. [Workshop of Interesting Topics of SEM and ESEM, Mikulov, 26.08.2014-31.08.2014, CZ].

Piňos, Jakub; Konvalina, Ivo; Kasl, J.; Jandová, D.; Mikmeková, Šárka. Microstructural characterization of metallic materials using advanced SEM techniques. In 18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7. [International Microscopy Congres /18./, Praha, 07.09.2014-12.09.2014, CZ].

Pokorná, Zuzana; Knápek, Alexandr; Jašek, O.; Prášek, J.; Majzlíková, P. Imaging of carbon nanostructures by low energy STEM below 5 keV. In 18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7. [International Microscopy Congres /18./, Praha, 07.09.2014-12.09.2014, CZ].

2013

Knápek, Alexandr; Pokorná, Zuzana. Algorithm for Analysis of a Data Cube of Electron Micrographs. In o326. [Microscopy Conference 2013, Regensburg, 25.08.2013-30. 08.2013, DE].

Knápek, Alexandr; Pokorná, Zuzana. Automatic Grain Boundary Detection of Polycrystalline Materials from Multiple SLEEM Images. In IMA 2013. 8th International Conference on Instrumental Methods of Analysis: Modern Trends and Applications. Book of Abstracts. Thessaloniki: Laboratory of Analytical Chemistry, Department of Chemical Engineering, AUTh, 2013, S. 177. [IMA 2013. International Conference on Instrumental Methods of Analysis: Modern Trends and Applications /8./, Thessaloniki, 15.09.2013-19.09.2013, GR].

Konvalina, Ivo; Müllerová, Ilona. Collection of signal electrons in Low Energy SEM. In Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, S. 327-328. [Microscopy Conference 2013, Regensburg, 25.08.2013-30. 08.2013, DE].

Pokorná, Zuzana; Knápek, Alexandr. Scanning Low Energy Electron Microscopy for the determination of crystallographic orientation of polycrystalline metal grains. In Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, S. 329-330. [Microscopy Conference 2013, Regensburg, 25.08.2013-30. 08.2013, DE].

Pokorná, Zuzana; Knápek, Alexandr. Very low energy electrons as a tool for investigation of polycrystalline materials. In IMA 2013. 8th International Conference on Instrumental Methods of Analysis: Modern Trends and Applications. Book of Abstracts. Thessaloniki: Laboratory of Analytical Chemistry, Department of Chemical Engineering, AUTh, 2013, S. 146. [IMA 2013. International Conference on Instrumental Methods of Analysis: Modern Trends and Applications /8./, Thessaloniki, 15.09.2013-19.09.2013, GR].

2012

Frank, Luděk; Mikmeková, Šárka; Hovorka, Miloš; Pokorná, Zuzana; Müllerová, Ilona. Overview of SEM developments and potential. In EMC 2012. Proceedings of the 15th European Microscopy Congress. Physical Sciences: Tools and Techniques vol. 2. Manchester: The Royal Microscopical Society, 2012, S. 121-122. ISBN 978-0-9502463-6-9. [EMC 2012. European Microscopy Congress /15./, Manchester, 16.09.2012-21.09.2012, US].

Frank, Luděk; Mikmeková, Šárka; Mika, Filip; Müllerová, Ilona. Surface crystallinity at the sight of electrons. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 17-20. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

Hovorka, Miloš; Konvalina, Ivo; Frank, Luděk; Mikulík, P. Mapping of dopants in silicon by electron injection. In Fejfar, A.; Vetushka, A. (ed.). Physic and Nanoscale. (Proceedings of the 10th IUVSTA International Summer School ). Praha: IOP AS CR, 2012. ISBN 978-80-260-0619-0. [Physics at Nanoscale. IUVSTA International Summer School /10./, Devět skal, 30.05.2012-04.06.2012, CZ].

Hovorka, Miloš; Müllerová, Ilona; Frank, Luděk. Very Low Energy STEM and Imaging of Free-standing Foils. In Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 411:1-2. ISBN 978-1-74052-245-8. [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22), Perth, 05.02.2012-09.02.2012, AU].

Knápek, A.; Brüstlová, J.; Trčka, T.; Klampár, M.; Mikmeková, Šárka. Surface examination of ultra-sharp cold field-emission cathode. In Koktavý, Pavel; Brüstlová, Jitka (ed.). New Trends in Physics 2012. Proceedings of the conference. Brno: University of technology, 2012, S. 51-56. ISBN 978-80-214-4594-9. [New Trends in Physics 2012, Brno, 11.10.2012-12.10.2012, CZ].

Kolařík, Vladimír; Zobač, Martin; Fořt, Tomáš; Vlček, Ivan; Dupák, Libor; Mikmeková, Šárka; Mikmeková, Eliška; Mrňa, Libor; Horáček, Miroslav; Sobota, Jaroslav. Institute of Scientific Instruments: An Overview Presenatation. In METAL 2012 Conference Proceedings. 21st International Conference on Metallurgy and Materials. Ostrava: TANGER Ltd, 2012, S. 26-31. ISBN 978-80-87294-29-1. [METAL 2012. International Conference on Metallurgy and Materials /21./, Brno, 23.05.2012-25.05.2012, CZ].

Mikmeková, Eliška; Mikmeková, Šárka; Müllerová, Ilona; Sobota, Jaroslav. Influence of annealing to stress in CNx:(H) films observed by SLEEM. In METAL 2012 Conference Proceedings. 21st International Conference on Metallurgy and Materials. Ostrava: TANGER Ltd, 2012. ISBN 978-80-87294-29-1. [METAL 2012. International Conference on Metallurgy and Materials /21./, Brno, 23.05.2012-25.05.2012, CZ].

Mikmeková, Eliška; Müllerová, Ilona; Sobota, Jaroslav. Observation of high stressed hydrogenated carbon nitride films by SLEEM. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 43-44. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

Mikmeková, Šárka; Mrňa, Libor; Mikmeková, Eliška; Müllerová, Ilona; Frank, Luděk. Examination of metals and alloys with slow and very slow electrons. In METAL 2012 Conference Proceedings. 21st International Conference on Metallurgy and Materials. Ostrava: TANGER Ltd, 2012. ISBN 978-80-87294-29-1. [METAL 2012. International Conference on Metallurgy and Materials /21./, Brno, 23.05.2012-25.05.2012, CZ].

Mikmeková, Šárka; Müllerová, Ilona; Frank, Luděk. Characterization of industrial materials by slow and very slow electrons. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 45-46. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

Mikulík, P.; Humlíček, J.; Hovorka, Miloš; Kulha, P.; Kadlec, F. Education and research at clean room laboratory for silicon device technology at Masaryk University. In Fejfar, A.; Vetushka, A. (ed.). Physic and Nanoscale. (Proceedings of the 10th IUVSTA International Summer School ). Praha: IOP AS CR, 2012. ISBN 978-80-260-0619-0. [Physics at Nanoscale. IUVSTA International Summer School /10./, Devět skal, 30.05.2012-04.06.2012, CZ].

Müllerová, Ilona; Konvalina, Ivo; Hovorka, Miloš; Mika, Filip. Approaches to the Collection Contrast in the Immersion Objective Lens of the Scanning Electron Microscope. In Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 410:1-2. ISBN 978-1-74052-245-8. [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22), Perth, 05.02.2012-09.02.2012, AU].

Müllerová, Ilona; Konvalina, Ivo; Mika, Filip. Collection contrast in the immersion objective lens of the scanning electron microscope. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, -, -, s. 49-50. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

Müllerová, Ilona; Konvalina, Ivo; Mika, Filip. Collection contrast in the immersion objective lens of the scanning electron microscope. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 49-50. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

Müllerová, Ilona; Mikmeková, Šárka; Matsuda, K.; Mikmeková, Eliška; Ikeno, S.; Shiojiri, M. SLEEM and its Applications in Material Research. In Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 409: 1-2. ISBN 978-1-74052-245-8. [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22), Perth, 05.02.2012-09.02.2012, AU].

Neděla, Vilém; Konvalina, Ivo; Lencová, B.; Zlámal, J.; Jirák, J. New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes. In Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 370:1-2. ISBN 978-1-74052-245-8. [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22), Perth, 05.02.2012-09.02.2012, AU].

Pokorná, Zuzana; Frank, Luděk. Imaging the local density of electronic states by very low energy electron reflectivity. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 57-58. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

Pokorná, Zuzana; Mikmeková, Šárka; Matsuda, K.; Müllerová, Ilona; Frank, Luděk. Backscattered electrons in examination of materials. In Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 940:1-2. ISBN 978-1-74052-245-8. [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22), Perth, 05.02.2012-09.02.2012, AU].

Sergeev, E.; Knápek, A.; Mikmeková, Šárka; Grmela, L.; Klampár, M. Material characterization of the epoxy-coated cold-field-emission cathodes. In Tóthová, Jana; Lisý, Vladimír (ed.). Physics of materials 2012. Proceedings of the scientific conference. Košice: Technical University of Košice, 2012, S. 109-112. ISBN 978-80-553-1175-3. [Physics of Materials 2012, Košice, 17.10.2012-19.10.2012, SK].

Zobačová, Jitka; Hüger, E.; Urbánek, Michal; Polčák, J.; Frank, Luděk. Imaging of SiCN thin films on silicon substrate in the scanning low energy electron microscope. In Fejfar, A.; Vetushka, A. (ed.). Physic and Nanoscale. (Proceedings of the 10th IUVSTA International Summer School ). Praha: IOP AS CR, 2012. ISBN 978-80-260-0619-0. [Physics at Nanoscale. IUVSTA International Summer School /10./, Devět skal, 30.05.2012-04.06.2012, CZ].

2011

Frank, Luděk; Pokorná, Zuzana; Mikmeková, Šárka; Müllerová, Ilona. Backscattered electrons in the SEM imaging. In Proceedings of the 10th Multinational Congress on Microscopy 2011. Urbino: SISM, 2011, S. 65-66. [Multinational Congress on Microscopy 2011 /10./ - MCM 2011, Urbino, 04.09.2011-09.09.2011, IT].

Hovorka, Miloš; Konvalina, Ivo; Frank, Luděk; Mikulík, P. Mapping of dopants in silicon by injection of electrons. In MC 2011 - Microscopy Conference Kiel. Kiel: DGE, 2011, IM7.P198:1-2. ISBN 978-3-00-033910-3. [MC 2011 - Microscopy Conference, Kiel, 28.08.2011-02.09.2011, DE].

Konvalina, Ivo; Hovorka, Miloš; Müllerová, Ilona. Electron optical properties of a focusing magnetic/immersion-magnetic lens combined with a cathode lens. In MC 2011 - Microscopy Conference Kiel. Kiel: DGE, 2011, IM1.112:1-2. ISBN 978-3-00-033910-3. [MC 2011 - Microscopy Conference, Kiel, 28.08.2011-02.09.2011, DE].

Mikmeková, Šárka; Man, O.; Pantělejev, L.; Hovorka, Miloš; Müllerová, Ilona; Frank, Luděk; Kouřil, M. Strain Mapping by Scanning Low Energy Electron Microscopy. In Šandera, P. (ed.). Materials Structure and Micromechanics of Fracture VI (Key Engineering Materials Vol. 465). Zurich: Trans Tech Publications, 2011, S. 338-341. ISBN 978-3-03785-006-0. ISSN 1662-9795. [MSMF-6: Materials Structure and Micromechanics of Fracture VI, Brno, 28.06.2010-30.06.2010, CZ].

Müllerová, Ilona; Hovorka, Miloš; Konvalina, Ivo; Frank, Luděk. Examination of ultrathin films with slow electrons. In Proceedings of the 10th Multinational Congress on Microscopy 2011. Urbino: SISM, 2011, S. 59-60. [Multinational Congress on Microscopy 2011 /10./ - MCM 2011, Urbino, 04.09.2011-09.09.2011, IT].

Müllerová, Ilona; Hovorka, Miloš; Mikmeková, Šárka; Pokorná, Zuzana; Mikmeková, Eliška; Frank, Luděk. Scanning Very Low Energy Electron Microscopy. In NANOCON 2011. 3rd International Conference. Ostrava: Tanger spol. s r. o, 2011, S. 238-243. ISBN 978-80-87294-27-7. [NANOCON 2011. International Conference /3./, Brno, 21.09.2011-23.09.2011, CZ].

Sobota, Jaroslav; Krejčí, J.; Neděla, Vilém; Fořt, Tomáš; Mikmeková, Eliška; Flodrová, Eva. Electrochemical performance of B, N, O and H doped DLC films deposited by reactive magnetron sputtering. In 2nd International Conference on Bio-Sensing Technology 2011. Amsterdam: Elsevier, 2011, P178: 1. [Bio-Sensing Technology 2011 /2./, Amsterdam, 10.10.2011-12.10.2011, NL].

2010

Hovorka, Miloš; Konvalina, Ivo; Frank, Luděk. Mapping of dopants by electron injection. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 15-16. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Hovorka, Miloš; Frank, Luděk. Mapping of Dopants in Silicon by Injection of Electrons. In Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, S. 15-18. ISBN 978-4-9903248-2-7. [JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology, Toyama, 12.09.2010-15.09.2010, JP].

Konvalina, Ivo; Hovorka, Miloš; Müllerová, Ilona. Electron optical properties of the cathode lens combined with a focusing magnetic/immersion-magnetic lens. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 21-22. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Konvalina, Ivo; Hovorka, Miloš; Fořt, Tomáš; Müllerová, Ilona. Optical and scanning electron microscopies in examination of ultrathin foils. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 23-24. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Matsuda, K.; Mizutani, M.; Nishimura, K.; Kawabata, T.; Hishinuma, Y.; Aoyama, S.; Müllerová, Ilona; Frank, Luděk; Ikeno, S. Superconductive property and microstructure of MgB2/Al composite materials. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 33-34. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Mika, Filip; Hovorka, Miloš; Frank, Luděk. Imaging of dopants under presence of surface ad-layers. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 35-36. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ]. Mikmeková, Šárka; Hovorka, Miloš; Müllerová, Ilona; Frank, Luděk. Low Energy Reflection and High Angle Reflection of Electrons in the SEM. In Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I3.7: 1-2. ISBN 978-85-63273-06-2. [International Microscopy Congress (IMC17) /17./, Rio de Janeiro, 19.09.2010-24.09.2010, BR].

Mikmeková, Eliška; Urbánek, Michal; Fořt, Tomáš; Di Mundo, R. Effect of Hydrogen on the Properties of Amorphous Carbon Nitride Films. In 2010 International Conference on Manufacturing Science and Technology (ICMST 2010). Chengdu: Institute of Electrical and Electronics Engineers, Inc, 2010, S. 291-295. ISBN 978-1-4244-8759-2. [International Conference on Manufacturing Science and Technology - ICMST 2010, Kuala Lumpur, 26.11.2010-28.11.2010, MY].

Mikmeková, Šárka; Hovorka, Miloš; Konvalina, Ivo; Müllerová, Ilona; Frank, Luděk. Prospects of the scanning low energy electron microscopy in materials science. In H, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 37-38. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Mikmeková, Šárka; Matsuda, K.; Watanabe, K.; Mizutani, M.; Narukawa, Y.; Müllerová, Ilona; Frank, Luděk. Scanning Low Energy Electron Microscopy - A PowerfuleTool for Materials Science. In Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, S. 77-78. ISBN 978-4-9903248-2-7. [JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology, Toyama, 12.09.2010-15.09.2010, JP].

Müllerová, Ilona; Hovorka, Miloš; Frank, Luděk. Advances in Low Energy Scanning Electron Microscopy. In Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, S. 256-257. ISBN 978-85-63273-06-2. [International Microscopy Congress (IMC17) /17./, Rio de Janeiro, 19.09.2010-24.09.2010, BR].

Müllerová, Ilona; Hovorka, Miloš; Frank, Luděk. Examination of Very Thin Free-standing Films with Slow Electrons. In Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, S. 45-48. ISBN 978-4-9903248-2-7. [JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology, Toyama, 12.09.2010-15.09.2010, JP].

Müllerová, Ilona; Hovorka, Miloš; Frank, Luděk. Transmission mode in scanning low enery electron microscope. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 41-42. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Pokorná, Zuzana; Frank, Luděk. Mapping the local density of states above vacuum level by very low energy electron reflectivity. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 53-54. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Zobačová, Jitka; Mikmeková, Šárka; Polčák, J.; Frank, Luděk. Imaging of thermal treated thin films on silicon substrate in the scanning low energy electron microscope. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 69-70. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Proceedings Paper - Czech Conference

2013

Frank, Luděk; Nebesářová, Jana; Vancová, Marie; Paták, Aleš; Müllerová, Ilona. Very low energy STEM for biology. In Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, S. 19. [Mikroskopie 2013, Lednice, 13.05.2013-14.05.2013, CZ].

Müllerová, Ilona; Řiháček, Tomáš. Electron vortex beam. In Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, S. 17. [Mikroskopie 2013, Lednice, 13.05.2013-14.05.2013, CZ].

Novotný, Peter; Konvalina, Ivo; Mika, Filip; Müllerová, Ilona. Simulation of electron trajectories in thin foils and electromagnetic fields of STEM. In Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, S. 63. [Mikroskopie 2013, Lednice, 13.05.2013-14.05.2013, CZ].

Pokorná, Zuzana. Reflectivity of very low energy electrons from polycrystalline metal samples. In Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, S. 9. [Mikroskopie 2013, Lednice, 13.05.2013-14.05.2013, CZ].

2011

Frank, Luděk; Mikmeková, Šárka; Konvalina, Ivo; Müllerová, Ilona; Hovorka, Miloš. Prospects of the scanning low energy electron microscopy in materials science. In Frank, L.; Hozák, P. (ed.). Mikroskopie 2011. Nové Město na Moravě: Československá mikroskopická společnost, 2011, S. 42. ISBN N. [Mikroskopie 2011, Nové Město na Moravě, 17.02.2011-18.02.2011, CZ].

Hovorka, Miloš; Konvalina, Ivo; Frank, Luděk. Mapping of dopants in silicon by injection of electrons. In Frank, L.; Hozák, P. (ed.). Mikroskopie 2011. Nové Město na Moravě: Československá mikroskopická společnost, 2011, S. 46. ISBN N. [Mikroskopie 2011, Nové Město na Moravě, 17.02.2011-18.02.2011, CZ].

Konvalina, Ivo; Hovorka, Miloš; Mikmeková, Šárka; Müllerová, Ilona. Image contrasts in the scanning electron microscopy. In Frank, L.; Hozák, P. (ed.). Mikroskopie 2011. Nové Město na Moravě: Československá mikroskopická společnost, 2011, S. 49. ISBN N. [Mikroskopie 2011, Nové Město na Moravě, 17.02.2011-18.02.2011, CZ].

2010

Konvalina, Ivo; Müllerová, Ilona. Analysis of a combined electrostatic and magnetic objective lens. In Frank, L.; Hozák, P. (ed.). Mikroskopie 2010. Nové Město na Moravě: Československá mikroskopická společnost, 2010, S. 41. ISBN N. [Mikroskopie 2010, Nové Město na Moravě, 17.02.2010-18.02.2010, CZ].

Mikmeková, Eliška; Sobota, Jaroslav; Caha, O.; Mikmeková, Šárka. Study of intrinsic stress in CNx films prepared by magnetron sputtering device using electron microscopy. In Frank, L.; Hozák, P. (ed.). Mikroskopie 2010. Nové Město na Moravě: Československá mikroskopická společnost, 2010, S. 56. ISBN N. [Mikroskopie 2010, Nové Město na Moravě, 17.02.2010-18.02.2010, CZ].

Mikmeková, Šárka; Hovorka, Miloš; Müllerová, Ilona; Frank, Luděk; Man, O.; Pantělejev, L.; Kouřil, M. Mapping of the microscopic strain using scanning low energy electron microscopy. In Frank, L.; Hozák, P. (ed.). Mikroskopie 2010. Nové Město na Moravě: Československá mikroskopická společnost, 2010, S. 20. ISBN N. [Mikroskopie 2010, Nové Město na Moravě, 17.02.2010-18.02.2010, CZ].

Pokorná, Zuzana; Frank, Luděk. Vacuum level by very low energy electron reflectivity vacuum level by very low energy electron reflectivity. In Frank, L.; Hozák, P. (ed.). Mikroskopie 2010. Nové Město na Moravě: Československá mikroskopická společnost, 2010, S. 60. ISBN N. [Mikroskopie 2010, Nové Město na Moravě, 17.02.2010-18.02.2010, CZ].

Contractual Research

2012

Mikmeková, Šárka. SMV-2012-15: Studium mikrostruktury žáropevných ocelí pomocí mikroskopie pomalými elektrony. Brno: Výzkumný a zkušební ústav Plzeň, s.r.o, 2012. 14 s.

Mikmeková, Šárka. SMV-2012-20: Studium mikrostrukury žáropevných ocelí pomocí nekonvenčních metod elektronové mikroskopie. Brno: Západočeská univerzita v Plzni, 2012. 9 s.

Collaborative Research

2012

Müllerová, Ilona; Frank, Luděk; Klein, Pavel; Sýkora, Jiří. Detektor krystalografického kontrastu s vysokým rozlišením pro zobrazování velmi pomalými elektrony. 2012.

Müllerová, Ilona; Frank, Luděk; Klein, Pavel; Sýkora, Jiří. Detektor pomalých prošlých elektronů pro ultravysokovakuovou aparaturu rastrovacího elektronového mikroskopu s velmi pomalými elektrony. 2012.