NanoESCA

Mgr. Martin Vondráček, Dr. Vladimír Cháb, Ing. Kateřina Horáková, Dr. Stanislav Cichoň

NanoESCA - ultra high vacuum Photo Electron Emission Microscopy (PEEM) system with resolution for real-space and momentum-space imaging and spectroscopy

Chemical state mapping – X-ray Photoelectron Spectroscopy, analyzing smallest sample structures giving chemical state information.

Real time sample navigation - PEEM technique - secondary electron régime, quantitative information on the very local work function and local sample charging.

Analyzing the k-space from µm-areas e.g. small grains in a polycrystalline surface with ultimate angular acceptance.

Spectroscopy mode (ESCA): Excitation source – Al Kα, spot size: 10-100 μm Energy resolution: 0.3 eV
ESCA imaging (element imaging): Excitation source – Al Kα, Field of view: 5-600 μm Lateral resolution: 400 nm Energy resolution: 0.4 eV
Energy filtered PEEM: Excitation source – Hg or any other Field of view: 8-600 μm Lateral resolution: 40 nm Energy resolution: 0.05 eV Work function measurement, ESCA imaging
Spectroscopy mode (UPS): Excitation source: HeI, HeII, (Ar, Ne, Xe also possible) Angle integrated spot size cca 1 mm Energy resolution: 0.1 eV
PEEM (photoemission electron microscopy) mode: Excitation source – Hg Field of view: 4-600 μm Lateral resolution: 20 nm Energy resolution: 0.05 eV Work function measurement
k-space imaging PEEM mode: Excitation source: HeI, HeII Field of view: 1-8 μm Image size: ± 2 Å-1 Angular resolution: ± 0.01 Å-1 Energy resolution: 0.05 eV Dark field imaging (imaging of the real space from a chosen diffraction spot)

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