Laboratory of electron and ion microscopy and microanalysis

    Characterization of surfaces by scanning electron microscopy, energy dispersive X-ray spectroscopy, cathodoluminescence and secondary ion mass spectrometry FIB TOF SIMS

      1. Scanning electron microscope TESCAN LYRA3 GM with SE and BSE detectors in the chamber, In-beam SE a In-beam BSE detectors in the column, FIB source of Ga+ ions, gas injection system of 5 gases, TOF mass spectrometer, decontaminator.


      Laboratory of electron and ion microscopy and microanalysis

        Characterization of surfaces by energy dispersive X-ray spectroscopy and cathodoluminescence.

          1. Scanning electron microscope Philips XL30 ESEM with SE and BSE detectors in the chamber, EDX detector and cathodoluminescence detector.

          2. Carbon coater Quorum Technologies Q150R E.

          3. Optical microscope OLYMPUS BX51 with Nomarski contrast

           Scanning electron microscope Philips XL30 ESEM with SE and BSE detectors in the chamber, EDX detector and cathodoluminescence detector.  Carbon coater Quorum Technologies Q150R E.  Optical microscope OLYMPUS BX51 with Nomarski contrast

           

          IPE carries out fundamental and applied research in the scientific fields of photonics, optoelectronics and electronics. In these fields, IPE generates new knowledge and develops new technologies.

          Contact us

          Data box: m54nucy

          IČ: 67985882
          DIČ: CZ67985882