MAUD description

The double-crystal diffractometer MAUD (formerly DN-2) is designed for the measurements of neutron small-angle scattering in the high Q-resolution mode. In contrast to conventional double-crystal arrangements (step-by-step angular scanning), a fully asymmetric diffraction geometry on the elastically bent Si analyzer is employed to transfer the angular distribution of the scattered neutrons to the spatial distribution at position sensitive detector (PSD) which enables equisition of the whole scattering curve by a one-/two-dimensional PSD. It reduces the exposure time per sample typically to 0.5-5 hours (depending on the particular Q-resolution and sample cross-section).

MAUD is suitable for investigation of inhomogeneities in the size range from 20-50 nm up to several micrometres and is thus complementary to conventional pin-hole SANS facilities (see e.g. SANS I at SINQ) and Bonse-Hart or focusing USANS (e.g. KWS-3 at MLZ).

Instrument Parameters

Sample environment

To enhance the possibility to measure the samples at various conditions, several sample environments can be put on MAUD beam. For non-ambient condition studies, a vacuum furnace can be used. Samples within a set can be automatically exchanged by sample changer for up to 9 samples or sample changer 2 with 5 positions and temperature regulation (20-90⁰C). For mechanical testing, a deformation rig can be employed with maximum tensile/pressure load up to 20 kN. For measurement of anisotropic samples, a rotation table can be installed. Statical magnetic field can be applied to sample to sample either horizontally or vertically by help of electrical magnet up to 2 Tesla (20000 G).