Publikace - Mikroskopie a mikroanalýza

Článek v odborném periodiku

2018

Dapor, M., Masters, R., Ross, I., Lidzey, D., Pearson, A., Abril, I., Garcia-Molina, R., Sharp, J., Unčovský, M., Vystavěl, T., Mika, Filip, Rodenburg, C. Secondary electron spectra of semi-crystalline polymers A novel polymer characterisation tool?i.Journal of Electron Spectroscopy and Related Phenomena. 2018, 222(JAN), 95-105. ISSN 0368-2048. ABSTRACT

Franc, A., Muselík, J., Zeman, J., Lukášová, I., Kurhajec, S., Bartoníčková, E., Galvánková, L., Mika, Filip, Dominik, M., Vetchý, D. The effect of amorphous and crystal sodium warfarin and its content uniformity on bioequivalence of tablets. European Journal of Pharmaceutical Sciences.  2018, 125(DEC), 120-129. ISSN 0928-0987. ABSTRACT

Walker, Christopher, Konvalina, Ivo, Mika, Filip, Frank, Luděk, Müllerová, Ilona. Quantitative comparison of simulated and measured signals in the STEM mode of a SEM. Nuclear Instruments & Methods in Physics Research Section B.  2018, 415(JAN), 17-24. ISSN 0168-583X. ABSTRACT

2017

Fialová, D.; Skoupý, Radim; Drozdová, E.; Paták, Aleš; Piňos, Jakub; Šín, L.; Beňuš, R.; Klíma, B. The Application of Scanning Electron Microscopy with Energy-Dispersive X-Ray Spectroscopy (SEM-EDX) in Ancient Dental Calculus for the Reconstruction of Human Habits. Microscopy and Microanalysis, 2017, vol. 23, iss. 6, pp. 1207-1213. ISSN 1431-9276. ABSTRACT

Knápek, Alexandr, Sobola, D., Tománek, P., Pokorná, Zuzana, Urbánek, Michal. Field emission from the surface of highly ordered pyrolytic graphite. Applied Surface Science.  2017, vol. 395, pp. 157-161. ISSN 0169-4332. ABSTRACT

Lukášová, I.; Muselík, J.; Franc, A.; Goněc, R.; Mika, Filip; Vetchý, D. Factor analysis in optimization of formulation of high content uniformity tablets containing low dose active substance. European Journal of Pharmaceutical Sciences, 2017, vol. 109, NOV, pp. 541-547. ISSN 0928-0987.  ABSTRACT 

Mika, Filip, Paták, Aleš, Pokorná, Zuzana. Možnosti zobrazení a analýzy v rastrovacím elektronovém mikroskopu s vysokým rozlišením. Jemná mechanika a optika.  2017, roč. 62, č. 10, s. 245-247. ISSN 0447-6441.

Schäfer, J.; Fricke, K.; Mika, Filip; Pokorná, Zuzana; Zajíčková, L.; Foest, R. Liquid assisted plasma enhanced chemical vapour deposition with a non-thermal plasma jet at atmospheric pressure. Thin Solid Films, 2017, vol. 630, MAY 30, pp. 71-78. ISSN 0040-6090. ABSTRACT

Vaškovicová, Naděžda; Skoupý, Radim; Paták, Aleš; Hrubanová, Kamila; Krzyžánek, Vladislav. Cathodoluminescence Study of Microdiamonds and Improvements of Signal Detection by Lowering Temperature of the Sample. Microscopy and Microanalysis, 2017, vol. 23, S1, pp. 2284-2285. ISSN 1431-9276. ABSTRACT

2016

Buršík, Josef; Soroka, Miroslav; Uhrecký, Róbert; Kužel, R.; Mika, Filip; Huber, Š. Thin (111) oriented CoFe2O4 and Co3O4 films prepared by decomposition of layered cobaltates. Applied Surface Science. 2016, vol. 376, JUL, pp. 209-218. ISSN 0169-4332. ABSTRACT

Mika, Filip. Recent Trends 2016. Akademický bulletin AV ČR. 2016, č. 7-8, s. 15. ISSN 1210-9525.

2015

Brzobohatý, Oto; Šiler, Martin; Trojek, Jan; Chvátal, Lukáš; Karásek, Vítězslav; Paták, Aleš; Pokorná, Zuzana; Mika, Filip; Zemánek, Pavel. Three-Dimensional Optical Trapping of a Plasmonic Nanoparticle using Low Numerical Aperture Optical Tweezers. Scientific Reports. 2015, vol. 5, JAN 29, 08106:1-9. ISSN 2045-2322. ABSTRACT

Buršík, Josef; Soroka, Miroslav; Kužel, R.; Mika, Filip. Growth and characterization of thin oriented Co3O4 (111) films obtained by decomposition of layered cobaltates NaxCoO2. Journal of Solid State Chemistry. 2015, vol. 227, JUL, pp. 17-24. ISSN 0022-4596. ABSTRACT

Frank, Luděk; Mika, Filip; Müllerová, Ilona. Optimizing the Recognition of Surface Crystallography. Microscopy and Microanalysis. 2015, vol. 21, S4, pp. 124-129. ISSN 1431-9276. ABSTRACT

Frank, Luděk; Nebesářová, Jana; Vancová, Marie; Paták, Aleš; Müllerová, Ilona. Imaging of tissue sections with very slow electrons. Ultramicroscopy. 2015, vol. 148, JAN., pp. 146-150. ISSN 0304-3991. ABSTRACT

Mika, Filip; Walker, Christopher; Konvalina, Ivo; Müllerová, Ilona. Imaging with STEM Detector, Experiments vs. Simulation. Microscopy and Microanalysis 2015, roč. 21, S4, s. 66-71. ISSN 1431-9276. ABSTRACT

Vaškovicová, Naděžda; Krzyžánek, Vladislav; Paták, Aleš. Ice Contamination Issues in the Visualization of the Ultrastructure of the Nuclear Envelope by Freeze-Fracture Technique. Microscopy and Microanalysis. 2015, vol. 21, S3, pp. 229-230. ISSN 1431-9276.

2013

Buršík, Josef; Vaněk, Přemysl; Mika, Filip. Role of reaction atmosphere in preparation of potassium tantalate through sol-gel method. Journal of Sol-Gel Science and Technology. 2013, vol. 68, iss. 2, pp. 219-233. ISSN 0928-0707. ABSTRACT

2012

Mika, Filip; Matějková-Plšková, J.; Jiwajinda, S.; Dechkrong, P.; Shiojiri, M. Photonic Crystal Structure and Coloration of Wing Scales of Butterflies Exhibiting Selective Wavelength Iridescence. Materials. 2012, vol. 5, iss. 5, pp. 754-771. ISSN 1996-1944. ABSTRACT

Mika, Filip; Paták, Aleš; Frank, Luděk. Rastrovací elektronový mikroskop s rozlišením pod 1 nm. Jemná mechanika a optika. 2012, roč. 57, č. 10, s. 281-282. ISSN 0447-6441.

Müllerová, Ilona; Hovorka, Miloš; Mika, Filip; Mikmeková, Eliška; Mikmeková, Šárka; Pokorná, Zuzana; Frank, Luděk. Very low energy scanning electron microscopy in nanotechnology. International Journal of Nanotechnology. 2012, vol. 9, 8/9, pp. 695-716. ISSN 1475-7435. ABSTRACT

2011

Matějková-Plšková, J.; Mika, Filip; Shiojiri, S.; Shiojiri, M. Fine Structure of Wing Scales in Chrysozephyrus Ataxus Butterflies. Materials Transactions. 2011, vol. 52, iss. 3, pp. 297-303. ISSN 1345-9678. ABSTRACT

2010

Hovorka, Miloš; Mika, Filip; Mikulík, P.; Frank, Luděk. Profiling N-Type Dopants in Silicon. Materials Transactions. 2010, vol. 51, iss. 2, pp. 237-242. ISSN 1345-9678. ABSTRACT

Konferenční sborník - zahraniční konference

2018

Horáček, Miroslav, Knápek, Alexandr, Matějka, Milan, Krátký, Stanislav, Urbánek, M., Mika, Filip, Kolařík, Vladimír. Hiding e-beam exposure fields by deterministic 2D pattering. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 36-37. ISBN 978-80-87441-23-7.

Konvalina, Ivo, Paták, Aleš, Mikmeková, Eliška, Mika, Filip, Müllerová, Ilona. STEM modes in SEM. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 40-41. ISBN 978-80-87441-23-7.

 Mika, Filip, Pokorná, Zuzana, Konvalina, Ivo, Khursheed, A. Possibilites of a secondary electrons bandpass filter for standard SEM. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 46-47. ISBN 978-80-87441-23-7.

Mika, Filip, Pokorná, Zuzana, eds. Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018. ISBN 978-80-87441-23-7. ABSTRACT

Rodenburg, C., Masters, R., Abrams, K., Dapor, M., Krátký, Stanislav, Mika, Filip. Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts? In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 68-69. ISBN 978-80-87441-23-7.

Řiháček, Tomáš, Horák, M., Schachinger, T., Matějka, Milan, Mika, Filip, Müllerová, Ilona. Creation of electron vortex beams using the holographic reconstruction method in a scanning electron microscope. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 66-67. ISBN 978-80-87441-23-7.

2016

Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016. 80 pp. ISBN 978-80-87441-17-6. ABSTRACT

2014

Mika, Filip (ed.); Pokorná, Zuzana (ed.). 9th International Conference on Charged Particle Optics : Book of Abstracts Brno: Institute of Scientific Instruments, AS CR, v. v. i, 2014. 99 pp. ISBN 978-80-87441-11-4.

2012

Mika, Filip (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012. 78 s. ISBN 978-80-87441-07-7. ABSTRACT

2010

Mika, Filip (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010. 70 s. ISBN 978-80-254-6842-5. ABSTRACT 

Konferenční příspěvek – zahraniční konference

2018

Horáček, Miroslav, Knápek, Alexandr, Matějka, Milan, Krátký, Stanislav, Urbánek, M., Mika, Filip, Kolařík, Vladimír. Hiding e-beam exposure fields by deterministic 2D pattering. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 36-37. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Konvalina, Ivo, Paták, Aleš, Mikmeková, Eliška, Mika, Filip, Müllerová, Ilona. STEM modes in SEM. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 40-41. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Mika, Filip, Pokorná, Zuzana, Konvalina, Ivo, Khursheed, A. Possibilites of a secondary electrons bandpass filter for standard SEM. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

 Rodenburg, C., Masters, R., Abrams, K., Dapor, M., Krátký, Stanislav, Mika, Filip. Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 68-69. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Řiháček, Tomáš, Horák, M., Schachinger, T., Matějka, Milan, Mika, Filip, Müllerová, Ilona. Creation of electron vortex beams using the holographic reconstruction method in a scanning electron microscope. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 66-67. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

2017

Horáček, Miroslav, Meluzín, Petr, Krátký, Stanislav, Knápek, Alexandr, Mika, Filip, Chlumská, Jana, Matějka, František, Král, Stanislav, Brunn, Ondřej, Giričová, D., Kopal, Jaroslav, Kolařík, Vladimír. Deterministicky aperiodické obrazové zařízení. In: Růžička, Bohdan ed. Sborník příspěvků multioborové konference LASER57.  Brno: Ústav přístrojové techniky AV ČR, 2017, s. 34-35. ISBN 978-80-87441-21-3. [LASER57, Třešť, 08.11.2017-10.11.2017, CZ].

Horák, M., Křápek, V., Hrtoň, M., Metelka, O., Šamořil, T., Stöger-Pollach, M., Paták, Aleš, Šikola, T. Babinet principle for plasmonic antennas: complementarity and differences. In: Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A. ed. 13th Multinational Congress on Microscopy: Book of Abstracts.  Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017, s. 587-588. ISBN 978-953-7941-19-2. [Multinational Congress on Microscopy /13./, Rovinj, 24.09.2017-29.09.2017, HR].

Konvalina, Ivo, Paták, Aleš, Mika, Filip, Müllerová, Ilona. STEM modes in SEM – simulations and experiments. In: Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A. ed. 13th Multinational Congress on Microscopy: Book of Abstracts.  Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017, s. 140-141. ISBN 978-953-7941-19-2. [Multinational Congress on Microscopy /13./, Rovinj, 24.09.2017-29.09.2017, HR].

Mikmeková, Eliška, Frank, Luděk, Polčák, J., Paták, Aleš, Lejeune, M. Examination of 2D crystals in a low voltage SEM/STEM. In: Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A. ed. 13th Multinational Congress on Microscopy: Book of Abstracts.  Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017, s. 618-619. ISBN 978-953-7941-19-2. [Multinational Congress on Microscopy /13./, Rovinj, 24.09.2017-29.09.2017, HR].

2016

Konvalina, Ivo; Mika, Filip; Krátký, Stanislav; Müllerová, Ilona. Bandpass filter for secondary electrons in SEM - simulations. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 28-29. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Mika, Filip; Konvalina, Ivo; Krátký, Stanislav; Müllerová, Ilona. Bandpass filter for secondary electrons in SEM - experiments. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 36-37. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged

Rodenburg, C.; Masters, R.; Lidzey, D.; Unčovský, M.; Vystavěl, Tomáš; Mika, Filip. Secondary electron spectroscopy and energy selective imaging for the engineering of carbon based materials. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 58-59. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Řiháček, Tomáš; Mika, Filip; Matějka, Milan; Krátký, Stanislav; Müllerová, Ilona. Difraction in a scanning electron microscopie. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 56-57. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Šikula, J.; Grmela, L.; Bartlová, M.; Kuparowitz, T.; Knápek, Alexandr; Mika, Filip. Noise of Low-Energy Electron Beam. In 2015 International Conference on Noise and Fluctuations (ICNF) (Proceedings IEEE). Piscataway: IEEE, 2016. ISBN 978-1-4673-8335-6. [International Conference on Noise and Fluctuations (ICNF) /23./, Xi’an, 02.06.2015-06.06.2015, CN].

Šiler, Martin; Brzobohatý, Oto; Chvátal, Lukáš; Karásek, Vítězslav; Paták, Aleš; Pokorná, Zuzana; Mika, Filip; Zemánek, Pavel. Golden nanoparticle in optical tweezers: influence of shape and orientation on optical trapping. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 64-65. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

2015

Konvalina, Ivo; Mika, Filip; Müllerová, Ilona; Krátký, Stanislav. Band-pass-filter for secondary electrons in ultra-high resolution SEM. In MC 2015. Microscopy Conference Proceedings. Göttingen: DGE, 2015, S. 378-379. [Microscopy Conference 2015, Göttingen, 06.09.2015-11.09.2015, DE].

Řiháček, Tomáš; Mika, Filip; Matějka, Milan; Krátký, Stanislav; Müllerová, Ilona. Study of the coherence of the primary beam in the low energy scanning electron microscope. In MC 2015. Microscopy Conference Proceedings. Göttingen: DGE, 2015, S. 611-612. [Microscopy Conference 2015, Göttingen, 06.09.2015-11.09.2015, DE].

2014

Knápek, Alexandr; Mika, Filip; Prášek, J.; Majzlíková, P. SEM characterization of carbon nanotubes based active layers of chemical sensors. In Proceedings of the ISSE 2014. 37th International Spring Seminar on Electronics Technology. Piscataway: IEEE, 2014, S. 361-364. ISBN 978-1-4799-4455-2. [International Spring Seminar on Electronics Technology /37./, Dresden, 07.05.2014-11.05.2014, DE].

Krátký, Stanislav; Kolařík, Vladimír; Urbánek, Michal; Paták, Aleš; Horáček, Miroslav; Matějka, Milan. E-beam Nano-patterning for Electroforming Replication. In NANOCON 2014. 6th International conference proceedings. Ostrava: TANGER, 2014. ISBN 978-80-87294-55-0. [NANOCON 2014. International Conference /6./, Brno, 05.11.2014-07.11.2014, CZ].

Matějková-Plšková, J.; Mika, Filip; Jiwajinda, S.; Dechkrong, P.; Svidenská, S.; Shiojiri, M. Photonic Crystal Structure of Butterfly Wing Scales Exhibiting Selective Wavelength Iridescence. In 18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7. [International Microscopy Congres /18./, Praha, 07.09.2014-12.09.2014, CZ].

Müllerová, Ilona; Radlička, Tomáš; Mika, Filip; Krzyžánek, Vladislav; Neděla, Vilém; Sobota, Jaroslav; Zobač, Martin; Kolařík, Vladimír; Starčuk jr., Zenon; Srnka, Aleš; Jurák, Pavel; Zemánek, Pavel; Číp, Ondřej; Lazar, Josef; Mrňa, Libor. Main Activites of the Institute of Scientific Instruments. In Workshop of Interesting Topics of SEM and ESEM. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014, S. 7-8. ISBN 978-80-87441-12-1. [Workshop of Interesting Topics of SEM and ESEM, Mikulov, 26.08.2014-31.08.2014, CZ].

2013

Halašová, Klára; Pavlova, Ewa; Paruzel, Bartosz; Pfleger, Jiří; Šlouf, Miroslav; Mikmeková, Šárka; Paták, Aleš. Poly(3-hexylthiophene)/gold nanoparticle nanocomposites: relationship between morphology and electrical conductivity. In Benedickt, C.; Fathi, A. (ed.). Proceedings of the Polymer Processing Society 29th Annual Meeting - PPS-29. Nuremberg: Neue Materialien Bayreuth, 2013, S06-46. [International Conference of the Polymer Processing Society /29./ - PPS-29, Nuremberg, 15.07.2013-19.07.2013, DE].

Mika, Filip; Novotný, Peter; Konvalina, Ivo. Imaging with a STEM detector, experiments vs. simulation. In Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, S. 51-52. [Microscopy Conference 2013, Regensburg, 25.08.2013-30. 08.2013, DE].

2012

Frank, Luděk; Mikmeková, Šárka; Mika, Filip; Müllerová, Ilona. Surface crystallinity at the sight of electrons. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 17-20. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

Kolařík, Vladimír; Matějka, František; Matějka, Milan; Horáček, Miroslav; Urbánek, Michal; Bok, Jan; Krátký, Stanislav; Král, Stanislav; Mika, Filip. What is the buzz about the TZ mode. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 37-38. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

Müllerová, Ilona; Konvalina, Ivo; Hovorka, Miloš; Mika, Filip. Approaches to the Collection Contrast in the Immersion Objective Lens of the Scanning Electron Microscope. In Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 410:1-2. ISBN 978-1-74052-245-8. [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22), Perth, 05.02.2012-09.02.2012, AU].

Müllerová, Ilona; Konvalina, Ivo; Mika, Filip. Collection contrast in the immersion objective lens of the scanning electron microscope. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, -, -, s. 49-50. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

Müllerová, Ilona; Konvalina, Ivo; Mika, Filip. Collection contrast in the immersion objective lens of the scanning electron microscope. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 49-50. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

2011

Burešová, I.; Dvořáková, P.; Hřivna, L.; Mika, Filip. Realtionship between protein content, bread-making quality and wheat endosperm microstructure. In Proteiny 2011. Sborník příspěvků VI. ročníku mezinárodní konference. Zlín: Univerzita Tomáše Bati, 2011, S. 36-39. ISBN 978-80-7454-022-6. [Proteiny 2011 /4./, Zlín, 03.05.2011-04.05.2011, CZ].

2010

Matějka, Milan; Rek, Antonín; Mika, Filip; Fořt, Tomáš; Matějková, Jiřina. Comparison of techniques for diffraction grating topography analysis. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 29-32. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Mika, Filip; Hovorka, Miloš; Frank, Luděk. Imaging of dopants under presence of surface ad-layers. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 35-36. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Konferenční příspěvek – lokální konference

2013

Frank, Luděk; Nebesářová, Jana; Vancová, Marie; Paták, Aleš; Müllerová, Ilona. Very low energy STEM for biology. In Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, S. 19. [Mikroskopie 2013, Lednice, 13.05.2013-14.05.2013, CZ].

Novotný, Peter; Konvalina, Ivo; Mika, Filip; Müllerová, Ilona. Simulation of electron trajectories in thin foils and electromagnetic fields of STEM. In Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, S. 63. [Mikroskopie 2013, Lednice, 13.05.2013-14.05.2013, CZ].

Smluvní výzkum

2014

Mika, Filip. SMV-2014-03: Analýza mikrostruktury syntetických diamantových prášků. Brno: EID Ltd, 2014. 2 s.

Mika, Filip. SMV-2014-18: Analýza mikrostruktury a materiálového složení v prozařovacím režimu. Brno: Contipro Boiotech, 2014. 2 s.

2013

Mika, Filip; Paták, Aleš. SMV-2013-03: Analýza mikrostruktury a materiálového složení anorganických nanočástic. Brno: Contipro Biotech s.r.o, 2013. 4 s.

Mika, Filip; Paták, Aleš. SMV-2013-06: Analýza mikrostruktury a chemického složení syntetických diamantových prášků. Brno: EID Ltd, 2013. 4 s.