Publikace - Elektronová optika

Článek v odborném periodiku

2020

Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Piňos, Jakub, Radlička, Tomáš, Frank, Luděk, Müllerová, Ilona, Materna-Mikmeková, Eliška. Very Low Energy Electron Transmission Spectroscopy of 2D Materials. Microscopy and Microanalysis. 2020, 26(S2), 2636-2638. ISSN 1431-9276. ABSTRACT

Stopka, Jan. Analytical formulae for trajectory displacement in electron beam and generalized slice method. Ultramicroscopy. 2020, 217(OCT), 113050. ISSN 0304-3991. ABSTRACT

2019

Obšil, P., Lešundák, Adam, Pham, Minh Tuan, Lakhmanskiy, K., Podhora, L., Oral, Martin, Číp, Ondřej, Slodička, L. A room-temperature ion trapping apparatus with hydrogen partial pressure below 10(-11) mbar. Review of Scientific Instruments.  2019, 90(8), 083201. ISSN 0034-6748. ABSTRACT

Oral, Martin, Číp, Ondřej, Slodička, L. Simulation of motion of many ions in a linear Paul trap. International Journal of Modern Physics. A. 2019, 34(36), 1942003. ISSN 0217-751X. ABSTRACT

Radlička, Tomáš. Correction of parasitic aberrations of hexapole corrector using differential algebra method. Ultramicroscopy.  2019, 204, 81-90. ISSN 0304-3991. ABSTRACT

Stopka, Jan, Kruit, P. Statistical Coulomb interactions in multi-beam SEM. International Journal of Modern Physics. A. 2019, 34(36), 1942021. ISSN 0217-751X. ABSTRACT

Werner, W. S. M., Oral, Martin, Radlička, Tomáš, Zelinka, Jiří, Müllerová, Ilona, Bellissimo, A., Bertolini, G., Cabrera, H., Gurlu, O. Scanning tunneling microscopy in the field-emission regime: Formation of a two-dimensional electron cascade. Applied Physics Letters. 2019, 115(25), 251604. ISSN 0003-6951. ABSTRACT

2018

Flaes, D.E.B., Stopka, Jan, Turtaev, S., de Boer, J.F., Tyc, Tomáš, Čižmár, Tomáš. Robustness of Light-Transport Processes to Bending Deformations in Graded-Index Multimode Waveguides. Physical Review Letters.  2018, 120(23), 1-5, 233901. ISSN 0031-9007. ABSTRACT

Radlička, Tomáš, Unčovský, M., Oral, Martin. In lens BSE detector with energy filtering. Ultramicroscopy.  2018,  189, JUN,  102-108. ISSN 0304-3991. ABSTRACT

Zelinka, Jiří, Oral, Martin, Radlička, Tomáš. Novel simulation method of space charge effects in electron optical systems including emission of electrons. Ultramicroscopy.  2018,  184, 66-76. ISSN 0304-3991. ABSTRACT

2017

Zelinka, Jiří, Oral, Martin, Radlička, Tomáš. Simulace elktronově optických systémů s vysokým proudem ve svazku. Jemná mechanika a optika.  2017, roč. 62, č. 10, s. 266-269. ISSN 0447-6441.

2015

Knápek, Alexandr; Radlička, Tomáš; Krátký, Stanislav. Simulation and Optimization of a Carbon Nanotube Electron Source. Microscopy and Microanalysis 2015, vol. 21, S4, pp. 60-65. ISSN 1431-9276. ABSTRACT

Neděla, Vilém; Konvalina, Ivo; Oral, Martin; Hudec, Jiří. Monte Carlo Simulations of Signal Electrons Collection Efficiency and Development of New Detectors for ESEM. Microscopy and Microanalysis 2015, vol. 21, S3, pp. 1109-1110. ISSN 1431-9276.

Neděla, Vilém; Konvalina, Ivo; Oral, Martin; Hudec, Jiří. The Simulation of Energy Distribution of Electrons Detected by Segmental Ionization Detector in High Pressure Conditions of ESEM. Microscopy and Microanalysis 2015, vol. 21, S4, pp. 264-269. ISSN 1431-9276. ABSTRACT

Oral, Martin; Neděla, Vilém. Dynamic Correction of Higher-Order Deflection Aberrations in the Environmental SEM. Microscopy and Microanalysis 2015, vol. 21, S4, pp. 194-199. ISSN 1431-9276. ABSTRACT

Radlička, Tomáš. Wave Optical Calculation of Probe Size in Low Energy Scanning Electron Microscope. Microscopy and Microanalysis 2015, vol. 21, S4, pp. 212-217. ISSN 1431-9276. ABSTRACT

Zelinka, Jiří; Oral, Martin; Radlička, Tomáš. Simulation of Space Charge Effects in Electron Optical System Based on the Calculations of Current Density. Microscopy and Microanalysis 2015, vol. 21, S4, pp. 246-251. ISSN 1431-9276. ABSTRACT

2014

Sháněl, O.; Zlámal, Jakub; Oral, Martin. Calculation of the performance of magnetic lenses with limited machining precision. Ultramicroscopy 2014, roč. 137, FEB 2014, s. 1-6. ISSN 0304-3991. ABSTRACT

2012

Oral, Martin; Radlička, Tomáš; Lencová, B. Effect of sample tilt on PEEM resolution. Ultramicroscopy. 2012, vol. 119, S1, pp. 45-50. ISSN 0304-3991. ABSTRACT

2011

Kroupa, M.; Jakubek, J.; Krejčí, F.; Žemlička, J.; Horáček, Miroslav; Radlička, Tomáš; Vlček, Ivan. Coincidence imaging system with electron optics. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 633, Supl. 1, S270-S273. ISSN 0168-9002. ABTRACT

Neděla, Vilém; Konvalina, Ivo; Lencová, Bohumila; Zlámal, J. Comparison of calculated, simulated and measured signal amplification in variable pressure SEM. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 645, iss. 1, pp. 79-83. ISSN 0168-9002. ABSTRACT

Neděla, Vilém; Konvalina, Ivo; Lencová, B.; Zlámal, J. Simulation of Energy Selective signal Amplification in Gas Environment of Variable Pressure SEM. Microscopy and Microanalysis. 2011, vol. 17, Suppl. 2, pp. 920-921. ISSN 1431-9276. ABSTRACT

Oral, Martin; Lencová, Bohumila. Correction of sample tilt in FIB instruments. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 645, iss. 1, pp. 130-135. ISSN 0168-9002. ABSTRACT

Radlička, Tomáš; Lencová, Bohumila. Influence of the clusters on the Bi LMIS properties. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 645, iss. 1, pp. 124-129. ISSN 0168-9002. ABSTRACT

Zlámal, J.; Lencová, Bohumila. Development of EOD for the design in electron and ion microscopy. Nuclear Instruments & Methods in Physics Research Section A. 2011, vol. 654, iss. 1, pp. 278-282. ISSN 0168-9002. ABSTRACT

2010

Radlička, Tomáš; Lencová, Bohumila. Determination of analytical expansion from numerical field data. Ultramicroscopy. 2010, vol. 110, iss. 9, pp. 1198-1204. ISSN 0304-3991. ABSTRACT

Konferenční příspěvek – zahraniční konference

2018

Daniel, Benjamin, Radlička, Tomáš, Piňos, Jakub, Mikmeková, Šárka, Konvalina, Ivo, Frank, Luděk, Müllerová, Ilona. Very low energy electron transmission spectromicroscopy. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 14-15. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Oral, Martin, Číp, Ondřej, Slodička, L. Analysis of linear ion Paul traps using 3-D FEM and the azimuthal multipole expansion. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 52-55. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Radlička, Tomáš, Kolařík, Vladimír, Oral, Martin. Electron optical properties of a new low-energy scanning electron microscope with beam separator. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 64-65. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

Zouhar, Martin, Radlička, Tomáš, Oral, Martin, Konvalina, Ivo. Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar.  Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 86-87. ISBN 978-80-87441-23-7. [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr, 04.06.2018-08.06.2018, CZ].

2016

Daniel, Benjamin; Radlička, Tomáš; Piňos, Jakub; Frank, Luděk; Müllerová, Ilona. Very low energy STEM/TOF system. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 6-7. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Radlička, Tomáš; Oral, Martin. Correction of misalignment aberrations of a hexapole corrector using the differential algebra method. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 50-53. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

Rozbořil, Jakub; Oral, Martin; Radlička, Tomáš. Optimal X-ray detection for thin samples in low-energy STEM. In Mika, Filip (ed.). Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, S. 44-45. ISBN 978-80-87441-17-6. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr, 29.05.2016-03.06.2016, CZ].

2014

Müllerová, Ilona; Radlička, Tomáš; Mika, Filip; Krzyžánek, Vladislav; Neděla, Vilém; Sobota, Jaroslav; Zobač, Martin; Kolařík, Vladimír; Starčuk jr., Zenon; Srnka, Aleš; Jurák, Pavel; Zemánek, Pavel; Číp, Ondřej; Lazar, Josef; Mrňa, Libor. Main Activites of the Institute of Scientific Instruments. In Workshop of Interesting Topics of SEM and ESEM. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014, S. 7-8. ISBN 978-80-87441-12-1. [Workshop of Interesting Topics of SEM and ESEM, Mikulov, 26.08.2014-31.08.2014, CZ].

Oral, Martin; Radlička, Tomáš. Computations in Charged Particle Optics. In Workshop of Interesting Topics of SEM and ESEM. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014, S. 23-24. ISBN 978-80-87441-12-1. [Workshop of Interesting Topics of SEM and ESEM, Mikulov, 26.08.2014-31.08.2014, CZ].

2012

Neděla, Vilém; Konvalina, Ivo; Lencová, B.; Zlámal, J.; Jirák, J. New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes. In Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 370:1-2. ISBN 978-1-74052-245-8. [Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22), Perth, 05.02.2012-09.02.2012, AU].

Oral, Martin. Fast simulation of ToF spectrometers. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 51-54. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

Radlička, Tomáš. Calculation of difraction aberration using differential algebra. In Mika, F. (ed.). Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012, S. 59-62. ISBN 978-80-87441-07-7. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr, 25.06.2012-29.06.2012, CZ].

2010

Lencová, Bohumila. Recent developments and improvements of EOD program. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 25-28. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Oral, Martin. Ray tracing, aberration coefficients and intensity distribution. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 49-52. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Radlička, Tomáš. Properties of Bi LMIS with ion clusters. In Mika, F. (ed.). Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, S. 57-58. ISBN 978-80-254-6842-5. [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr, 31.05.2010-04.06.2010, CZ].

Zlámal, J.; Lencová, Bohumila. Accurate and Easy-to-use Electron Optical Design Program for Microscopy. In Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I1.6:1-2. ISBN 978-85-63273-06-2. [International Microscopy Congress (IMC17) /17./, Rio de Janeiro, 19.09.2010-24.09.2010, BR].

Konferenční příspěvek – lokální konference

2018

Vadlejch, Daniel, Oral, Martin, Lešundák, Adam, Pham, Minh Tuan, Čížek, Martin, Číp, Ondřej, Slodička, L. Výpočet průběhu potenciálů a simulace chování iontů vápníku v Paulově iontové pasti. In: Růžička, Bohdan, ed. Sborník příspěvků multioborové konference LASER58. Brno: Ústav přístrojové techniky AV ČR, 2018, s. 53-54. ISBN 978-80-87441-24-4.

Smluvní výzkum

2020

Radlička, Tomáš. SMV-2020-31: Návrh a simulace elektronově optických prvků. Brno: Thermo Fisher Scientific Brno, s.r.o., 2020. 6 s.

2019

Radlička, Tomáš. SMV-2019-64: Cs korektor realizovaný pomocí kombinace anulární a kruhové apertury. Brno: Thermo Fisher Scientific Brno s.r.o., 2019. 2 s.

Radlička, Tomáš. SMV-2019-77: Výpočet vlastností termoemisního zdroje. Brno: Thermo Fisher Scientific Brno s.r.o., 2019. 2 s.

2018

Radlička, Tomáš. SMV-2018-20: Elektronově optické vlatnosti multi-svazkového zdroje elektronů. Brno: FEI CZECH REPUBLIC, 2018. 5 s.

Radlička, Tomáš. SMV-2018-21: Výpočet optiky XPS zdroje. Brno: FEI CZECH REPUBLIC, 2018. 5 s.

2016

Radlička, Tomáš; Oral, Martin; Rozbořil, Jakub. SMV-2016-20: Výpočty detekčních systémů rastrovacích elektronových mikroskopů. Brno: FEI Czech Republic, s.r.o., 2016. 10 s.

Radlička, Tomáš. SMV-2016-21: DA modul pro EOD. Brno: Ing. Jakub Zlámal, Ph.D., 2016. 4 s.

2015

Radlička, Tomáš. SMV-2015-20: Analýza detekčních mechanizmů mikroskopu Teneo. Brno: FEI Czech Republic, s. r. o, 2015. 4 s.

Aplikované výsledky a užitný a průmyslový vzor

2020

Konvalina, Ivo, Frank, Luděk, Radlička, Tomáš, Zobač, Martin, Vlček, Ivan, Sýkora, Jiří, Klein, Pavel, Müllerová, Ilona, Materna-Mikmeková, Eliška. Elektrostatický tubus pro 2D detekci v UHV systému (mimo-osový pixelový detektor). Ústav přístrojové techniky AV ČR, v. v. i., 2020. Funkční vzorek APL-2020-06.

Krátký, Stanislav, Fořt, Tomáš, Matějka, Milan, Materna-Mikmeková, Eliška, Radlička, Tomáš, Řiháček, Tomáš, Sháněl, O., Schneider, M., Mareček, D. Fázová destička pro použití v transmisní elektronové mikroskopii. Ústav přístrojové techniky AV ČR, v. v. i., 2020. Funkční vzorek APL-2020-07.

Radlička, Tomáš, Řiháček, Tomáš, ORal, Martin, Seďa, B., Vašina, R. Annulární clona pro SEM. Ústav přístrojové techniky AV ČR, v. v. i., 2020. Funkční vzorek APL-2020-08.

Seďa, B., Vašina, R., Oral, Martin, Řiháček, Tomáš, Radlička, Tomáš. Nástavec pro objektivovou čočku. Ústav přístrojové techniky AV ČR, v. v. i., 2020. Funkční vzorek APL-2020-09.

2018

Frank, Luděk, Klein, Pavel, Konvalina, Ivo, Müllerová, Ilona, Radlička, Tomáš, Piňos, Jakub, Sýkora, Jiří. Spektrometr energií velmi pomalých elektronů. Ústav přístrojové techniky AV ČR, v. v. i., 2018. Funkční vzorek APL-2018-13.

Frank, Luděk, Klein, Pavel, Konvalina, Ivo, Müllerová, Ilona, Radlička, Tomáš, Piňos, Jakub, Sýkora, Jiří. Spektrometr energií velmi pomalých elektronů. Užitný vzor 32425. 10. 12. 2018.

Software

2019

Radlička, Tomáš, Oral, Martin. EDSpot. 2019.