Scanning near-field optical microscopy: a tool for determination of local material properties

Scanning near-field optical microscopy (SNOM) is an imaging technique that uses the apex of a very sharp tip for the observation of nanostructures with lateral resolution much beyond the diffraction limit. With this method we can extract the local properties of materials like dielectric permittivity and conductivity. In this work I will describe the principle of operation of scattered-type SNOM operating at THz frequencies and different theoretical models used to determine the local material properties.

The semina will be chaired by Hynek Němec, Department of Dielectrics.