Profile

He deals with the characterization of materials by Transmission Electron Microscopy (TEM). He specializes in in-situ TEM (heating, deformation) and TEM analytical techniques such as Electron Energy Loss Spectroscopy (EELS),  Energy Dispersive X-ray Spectroscopy (EDS) and Energy Filtered TEM (EFTEM). Concerning the materials, he is specializing in particular metals and thin layers.

In the past, he participated in such a specific field as the TEM analysis of radiation-induced damage in materials from a nuclear power plant.

ORCID 0000-0002-3251-1062
ResearcherID G-6247-2014
Scopus Author ID 57199500578
ResearchGate Jan_Duchon