Profile

  • Scintillation material characterization using amplitude spectrometry (light yield measurement, energy resolution measurement, etc.)
  • Epitaxial films scintillation and luminescence properties
  • Scintillation response kinetics characterization and its' influence on amplitude spectrum
  • Energy deposition in scintillation detectors and its' influence on detector response

ORCID: 0000-0002-2766-2907