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1. Schauer, F.; Schauer, P.; Kuřitka, I.; Nešpůrek, S.: Conjugated Silicon–Based Polymer Resists for Nanotechnologies: EB and UV Meditated Degradation Processes in Polysilanes. Materials Transactions, Special Issue on Development and Fabrication of Advanced Materials Assisted by Nanotechnology and Microanalysis, (online published November 26, 2009, ISSN: 1347-5320).

2. Schauer, P. Extended Algorithm for Simulation of Light Transport in Single Crystal Scintillation Detectors for S(T)EM., Scanning, 29 No.6 (2007), 249-253

3. Horák, P.; Schauer, P.: Cathodoluminescence as a method for the study of degradation of polysilanes. Nucl. Instrum. Methods Phys. Res. Sect. B - Beam Interact. Mater. Atoms 252 (2006), 303-307.

4. Schauer, P.; Nešpůrek, S.; Schauer, F.; Autrata, R.: Optimization of Poly-(Methylphenylsilylene) Specimens for Cathodoluminescence Measurement. Microscopy and Microanalysis 9 [Sup. 3] (2003) p.156-157.

5. Schauer, P.; Nešpůrek, S.; Schauer, F.; Autrata, R.: Cathodoluminescence Study of Silicon Polymers., Fine Mechanics and Optics, 48 (2003), 156-157.

6. Schauer, P.; Autrata, R.: Performance of Detector Elements for Electron Microscopes., Fine Mechanics and Optics, 45 (2000), 268-270.

7. Yamamoto, K.; Takayoshi, T.; Hibino, M.; Schauer, P.; Autrata, R.: Improvement of Light Collection Efficiency of Lens-Coupled YAG Screen TV System for a High-Voltage Electron Microscope., Microsc. Res. Technique, 49 (2000), 596-604.

8. Handlir, R.; Schauer, F.; Nespurek, S.; Kuritka, I.; Weiter, M.; Schauer, P.: Metastable States in Poly(methylphenylsilylene) Induced by UV Radiation and Electron Beam., J. Non-Crystalline Solids, 230 (1998), 669-672.

9. Autrata, R.; Hutař, O.; Schauer, P.: Low Voltage Single Crystal Backscatter Electron Detectors., J. Computer Assisted Microsc., 9 (1997), 105-106.

10. Schauer, P.; Autrata, R.: Scintillator-Photocathode Matching in Scintillation Detector for S(T)EM., J. Computer Assisted Microsc., 9 (1997), 119-120.

11. Schauer, P.; Autrata, R.: Inquiry of Detector Components for Electron Microscopy., Fine Mechanics and Optics, 42 (1997), 340-342.

12. Autrata, R.; Schauer, P.: Cathodoluminescent Properties of Single Crystal Materials for Elecron Microscopy., Scanning Microscopy (Supplement), 9 (1996), 1-12.

13. Autrata, R.; Schauer, P.: Ansammlung der Niederenergie-Signalelektronen im rotationssymmetrischen elektrostatischen Feld des Detektors., Optik (Supplement), 94 (1993), 26.

14. Hibino, M.; Irie, K.; Autrata, R.; Schauer, P.: Characteristics of YAG Single Crystals for Electron Scintillators of SEM., J. Electron. Microsc., 41 (1992), 453-457.

15. Schauer, P.; Autrata, R.: Light Transport in Single-Crystal Scintillation Detectors in SEM., Scanning, 14 (1992), 325-333.

16. Autrata R., Schauer P.: Monokrystalická stínítka pro převadeč nízkoenergiového elektronového obrazu., Jemná Mech. Opt., 36 (1991), 133-138.

17. Autrata R., Schauer P., Kvapil Ji., Kvapil Jos.: Die Anwendung der Einkristall-Scintillatoren und Sichtschrime in Elektronenmikroskopen., Beitr. Elektronenmikroskop. Direktabb. Oberfl., 18 (1985), 97.

18. Autrata R., Schauer P., Kvapil Jos., Kvapil Ji.: Single crystal aluminates - a new generation of scintillators in SEM and transparent screens in electron optical devices., Scanning Electron Microsc., (1983), 489-500.

19. Autrata R., Schauer P., Kvapil Ji., Kvapil Jos.: Cathodoluminescence efficiency of Y3Al5O12 and YAlO3 single crystal in dependence on Ce3+ and other dopants concentrations., Cryst. Res. Technol., 18 (1983), 907.

20. Autrata R., Schauer P., Kvapil Ji., Kvapil Jos.: A Single crystal of YAlO3:Ce3+ as a fast scintillator in SEM., Scanning, 5 (1983), 91-96.

21. Kvapil Ji., Perner B., Kvapil Jos., Manek B., Kubelka J., Blazek K., Autrata R., Schauer P., Vitamvas Z.: Spectral properties of oxide crystals free of iron ions., Cryst. Res. Technol., 17 (1982), 885.

22. Kvapil Ji., Kvapil Jos., Manek B., Perner B., Autrata R., Schauer P.: Czochralski growth of YAG:Ce in reducing protective atmosphere., J. Cryst. Growth, 52 (1981), 542.

23. Kvapil Jos., Kvapil Ji., Blazek K., Zikmund J., Autrata R.,Schauer P.: The luminescence efficiency of YAG:Ce phosphors., Czech. J. Phys. B, 30 (1980), 185.

24. Schauer P., Autrata R.: Electro-optical properties of a scintillation detector in SEM., J. Microsc. Spectrosc. Electron., 4 (1979), 633.

25. Autrata R., Schauer P.: Optoelektronika v elektronové mikroskopii., Slaboproudý obz., 39 (1978), 472.

26. Autrata R., Schauer P., Kvapil Jos., Kvapil Ji.: A single crystal of YAG:Ce - new fast scintillator in SEM., J. Phys E: Sci. Instrum., 11 (1978), 707.

27. Autrata R., Schauer P.: Scintilátory pro rastrovací elektronový mikroskop., Slaboproudý obz., 38 (1977), 511.

28. Žák J., Schauer P.: Stanovení termofyzikálních vlastností brambor metodou impulsně působícího přímkového zdroje tepla., Zemědělská technika, 22 (1976), 23.

29. Schauer P.: Napěťová závislost kapacity anodicky oxidovaného systému Al-Al2O3-Al., Cs. cas. fys. A, 21 (1971), 257.

1. Schauer, P.; Schauer, F.; Kuritka, I.; Nespurek, S. Cathodoluminescence study of electron beam formed defects in polysilanes. MC 2009 - Microscopy Conference 2009, Graz, Austria Sept 2009, Proceedings/Vol. 3, p.383-384.

2. Bok, J.; Schauer, P. LabVIEW controlled cathodoluminescence equipment. MC 2009 - Microscopy Conference 2009, Graz, Austria Sept 2009, Proceedings/Vol. 1, p.55-56.

3. Schauer, P.; Horak, P.; Schauer, F.; Kuritka, I.; Nespurek, S. Study of degradation and regeneration of silicon polymers using cathodoluminescence. EMC 2008 - 14th European Microscopy Congress, Aachen, Germany Sept 2008, Proceedings/Vol. 2, p.789-790.

4. Horák, P.; Kuřitka, I.; Schauer, P.; Schauer, F.; Sáha, P. Mechanism of poly[methyl(phenyl)silylene] e-beam degradation. 3rd European Weathering Symposium Natural and Arteficial Ageing of Polymers, Krakow Sept 2007, Proceedings, p.97-107.

5. Schauer, P. Enhancement of single crystal scintillators for scintillation detectors in S(T)EM. 8th Multinational Congress on Microscopy, Prague, Czech Rep. June 2007, Proceedings, p.105-106.

6. Horák, P.; Schauer, P. Analysis of electron beam degraded poly[methyl(phenyl)silylene]. 8th Multinational Congress on Microscopy, Prague, Czech Rep. June 2007, Proceedings, p.257-258.

7. Horák, P.; Schauer, P.: Effect of Electron Beam on Poly[Methyl(Phenyl)Silylene]. Mikroskopie 2006, Nové Město na Moravě, February 2006, Proceedings, p.33.

8. Schauer, F.; Kuřitka, I.; Zemek, J.; Horák, P.; Schauer, P.; Sáha, P.: Polysilanes for Nanorezists: Photoelecton Spectroscopy, UV and Electron Beam Degradation. 5th Int. Conference - Solid State Surfaces and Interfaces, Smolenice , Slovak Republic, November 19-24, 2006, (Edited and Published by Institute of Physics, SAS, Nov. 2006), p. 83.

9. Schauer, P.: Decay Time Optimization of YAG:Ce Scintillator for S(T)EM Electron Detector. IMC 16 - 16th International Microscopy Congress, Sapporo, Japan, September, 2006, Proceedings/Vol. 2, p.665.

10. Schauer, P.: Decay Kinetics of Scintillation Crystals for SEM Electron Detectors. 10th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský Dvůr (Brno) May 2006, Proceedings, p.63-64.

11. Schauer, P.; Autrata, R.: Extended Algorithm for Optimization of Photon Transport in Scintillation Detector. Dreiländertagung Microscopy Conference 2005, Davos, Switzerland, August 2005, Proceedings, p.55.

12. Horák, P.; Schauer, P.: Degradation of Poly[methyl(phenyl)silylene] cathodoluminescence. 2nd European Weathering Symposium - Natural and Artificial Ageing of Polymers, Gothenburg, Sweden, June 2005, Proceedings, p.311-319.

13. Schauer, P.; Autrata, R.: Monte Carlo Simulation Code for Photon Collection in S(T)EM Scintillation Detectors. 7th Multinational Congress on Microscopy, Portoroz, Slovenia, June 2005, Proceedings, p.199-200.

14. Horák, P.; Schauer, P.: Detekce slabé katodoluminiscence. Mikroskopie 2005, Nové Město na Moravě, únor 2005, Sborník, p.36.

15. Schauer, P.; Autrata, R.: Optimization of scintillation detector for SEM. EMC 2004 - 13th European Microscopy Congress, Antwerp, Belgium Aug 2004, Proceedings/Vol. I, p.69-70.

16. Autrata, R.; Schauer, P.: Nanoresolution BSE images created using a new type of YAG II scintillator. EMC 2004 - 13th European Microscopy Congress, Antwerp, Belgium Aug 2004, Proceedings/Vol. I, p.75-76.

17. Schneider, L.; Jirák, J.; Autrata, R.; Schauer, P.: Dependence of contrast on pressure using segmental ionization detector in environmental SEM. EMC 2004 - 13th European Microscopy Congress, Antwerp, Belgium Aug 2004, Proceedings/Vol. I, p.341-342.

18. Schauer, P.; Autrata, R.: Experimental and simulative methods for scintillation detector optimization. 9th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský Dvůr (Brno) July 2004, Proceedings, p.67-68.

19. Autrata, R.; Schauer, P.; Wandrol P.: New type of YAG-II scintillator for nanoresolution BSE imaging in SEM. 9th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský Dvůr (Brno) July 2004, Proceedings, p.11-12.

20. Horák, P.; Schauer, P.: Cathodoluminescence of polysilanes. 9th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský Dvůr (Brno) July 2004, Proceedings, p.31-32.

21. Horák, P.; Schauer, P.: Studium katodoluminiscenčních vlastností polysilanů. Mikroskopie 2004, Nové Město na Moravě, březen 2004, Sborník, s.25.

22. Schauer, P.; Nešpůrek, S.; Schauer, F.; Autrata, R.: Optimization of Poly-(Methylphenylsilylene) Specimens for Cathodoluminescence Measurement. Microscopy Conference 2003 (31st conference of Deutsche Gesellschaft für Elektronenmikroskopie), Dresden, Germany, September 2003, Proceedings, p.156-157.

23. Schauer, P.; Nešpůrek, S.; Schauer, F.; Autrata, R.: Electron Beam Degradation Study of Silicon Polymers. 6th Multinational Congress on Microscopy, Pula, Croatia June 2003, Proceedings, p.205-206.

24. Autrata, R.; Neděla, V.; Horký, D.; Schauer, P.: Comparison of Imaging with SE Ionisation and BSE Scintillation Detector in ESEM. 6th Multinational Congress on Microscopy, Pula, Croatia June 2003, Proceedings, p.487-488.

25. Schauer, P.; Autrata, R.: Experimental Setup for Cathodoluminescence Spectra Measurement. 15th International Congress on Electron Microscopy (ICEM 15), Durban, South Africa Sep 2002, Proceedings, Vol. 3 - Interdisciplinary, p.337-338.

26. Autrata, R.; Schauer, P.: New Fast and Efficient YAP Scintillator for the Detection i SEM. 15th International Congress on Electron Microscopy (ICEM 15), Durban, South Africa Sep 2002, Proceedings, Vol. 3 - Interdisciplinary, p.347-348.

27. Schauer, P.; Autrata, R.: Cathodoluminescence Spectra Measurement. 7th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský Dvůr (Brno) Jul 2002, Proceedings, p.67-70.

28. Autrata, R.; Schauer, P.: Improvement of Single Crystal Scintillator Properties in SEM Detectors. 6th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský Dvůr (Brno) Jul 2002, Proceedings, p.47-48.

29. Schauer, P.; Vlček, I.; Autrata, R.: Improved Recording System for the Study of Single Crystal Imaging Screens. 5th Multinational Congress on Electron Microscopy, Lecce, Italy Sep 2001, Proceedings, p.533-534.

30. Autrata, R.; Schauer, P.; Jirak, J.: Detection of backscattered electrons for biological speciments study. 5th Multinational Congress on Electron Microscopy, Lecce, Italy Sep 2001, Proceedings, p.519-520.

31. Schauer, P.; Autrata, R.: Performance of Detector Elements for Electron Microscopes. 12th European Congress on Electron Microscopy, Brno, Czech Republic Jul 2000, Proceedings/Vol. 3, p.I 455.

32. Schauer, P.; Autrata, R.: Study of TEM Fluorescent Screen. 4th Multinational Congress on Electron Microscopy, Veszprem, Hungary Sep 1999, Proceedings, p.167-168.

33. Yamamoto, K.; Tanji, T.; Hibino, M.; Schauer, P.; Autrata, R.: Improvement of Light Collection Efficiency of Lens Coupled YAG Screen TV System for HVEM. International Symposium on Atomic level Characterizations for New Materials and Devices '97, Maui, Hawaii, USA Nov 1997, Proceedings, p.98-101.

34. Autrata, R.; Schauer, P.: Single Crystal Scintillation Detectors for LVSEM. 14th International Congress on Electron Microscopy (ICEM 14), Cancun, Mexico Aug-Sep 1998, Proceedings/Vol. 1, p.437-438.

35. Schauer, P.; Autrata, R.: Performance of YAG:Ce Single Crystal Screens for TEM. 14th International Congress on Electron Microscopy (ICEM 14), Cancun, Mexico Aug-Sep 1998, Proceedings/Vol. 1, p.633-634.

36. Schauer, P.; Autrata, R.: Cathodoluminescent Properties of Single Crystals for S(T)EM Detectors. 6th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský Dvůr (Brno) Jun-Jul 1998, Proceedings, p.60-63.

37. Autrata, R.; Schauer, P.; Madea, D.: Single crystal scintillators for BSE detectors in SEM. EUREM-11, the Eleventh European Congress on Electron Microscopy (Edited and Published by the CESM, Brussels 1998), Dublin, Ireland August 1996, Proceedings/Vol. 1, p.467.

38. Schauer, P.; Autrata, R.: Computer optimized design of BSE scintillation detector for SEM. EUREM-11, the Eleventh European Congress on Electron Microscopy (Edited and Published by the CESM, Brussels 1998), Dublin, Ireland August 1996, Proceedings/Vol. 1, p.369.

39. Handlir, R.; Schauer, F.; Nespurek, S.; Kuritka, I.; Weiter, M.; Schauer, P.: Metastable States in Poly(methylphenylsilylene) Induced by UV Radiation and Electron Beam. International Conference on Amorphous and Microcrystalline Semiconductors (ICAMS 17), Budapest, Hungary Aug 1997, Proceedings, p.290.

40. Autrata, R.; Hutař, O.; Schauer, P.: Low Voltage Single Crystal Backscatter Electron Detectors. Multinational Congress on Elctron Microscopy, Portorož, Slovenia Oct 1997, Proceedings, p.281-182.

41. Schauer, P.; Autrata, R.: Scintillator-Photocathode Matching in Scintillation Detector for S(T)EM. Multinational Congress on Elctron Microscopy, Portorož, Slovenia Oct 1997, Proceedings, p.293-294.

42. Autrata, R.; Schauer, P.; Madea, D.: Single crystal scintillators for BSE detectors in SEM. 11th European Congress on Microscopy (EUREM 96), Dublin, Ireland August 1996, CD-ROM Proceedings, p..

43. Schauer, P.; Autrata, R.: Computer optimized design of BSE scintillation detector for SEM. 11th European Congress on Microscopy (EUREM 96), Dublin, Ireland August 1996, CD-ROM Proceedings, p..

44. Hibino, M.; Ban, K.; Tanaka, S.; Schauer, P.; Autrata, R.: High Resolution and High Collection Efficiency YAG Screen for Lens Coupling TV and CCD Camera. 6th Asia-Pacific Conference on Electron Microscopy (APEM), Hong Kong July 1996, Proceedings, p.45-46.

45. Schauer, P.; Autrata, R.: Computer Designed Scintillation Detectors for SEM. 5th Seminar of Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Brno, Czech Republic June 1996, Proceedings, p.73-74.

46. Autrata, R.; Schauer, P; Jirak, J.; Spinka, J.: Signal Detection in SEM. 5th Seminar of Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Brno, Czech Republic June 1996, Proceedings, p.43-46.

47. Schauer, P.; Autrata, R.: Some Methods for Investigation of Detector Components for Electron Microscopy. 5th Seminar of Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Brno, Czech Republic June 1996, Proceedings, p.47-50.

48. Schauer, P.; Autrata, R.: Spatial Resolution of YAG:Ce Single Crystal CL Screens. Multinational Congress on Electron Microscopy, St. Lesna, Slovak Rep Oct 1995, Proceedings, p.115-116.

49. Autrata, R.; Schauer, P.: Behaviour of Planar and Annular YAG Single Crystal Detectors for LVSEM Operation. 13th International Congress on Electron Microscopy (ICEM 13), Paris, France July 1994, Proceedings/Vol. I, p.71-72.

50. Schauer, P.; Autrata, R.: Time Response of Single Crystal Scintillation Detectors for SEM/STEM. 13th International Congress on Electron Microscopy (ICEM 13), Paris, France July 1994, Proceedings/Vol. I, p.227-228.

51. Autrata, R.; Schauer, P.: Cathodoluminescent Properties of Single Crystals for Electron Microscopy. Thirteenth Pfefferkorn Conference on Luminescence, Niagara Falls, Canada May 1994, Abstract Summary, p.1.

52. Schauer P., Autrata R.: Efficiency of SEM/STEM Scintillation Electron Detectors with Edge Guided Signal. Multinational Congress on Electron Microscopy, Parma, Italy Sept 1993, Proceedings, p.357-358.

53. Autrata R., Schauer P.: Collection of Low-Energy Signal Electrons in the Rotationally Symmetric Electrostatic Field of a Detector. Three Countries' EM Conference, BEDO 1993, Zurich, Switzerland Sept 1993, Proceedings, p..

54. Schauer P., Autrata R.: Coatings of Single Crystal Scintillators for Electron Detectors in SEM. 10th European Congress on Electron Microscopy, Granada, Spain Sept 1992, Proceedings/Vol. I, p.107.

55. Hibino M., Irie K., Autrata R., Schauer P.: YAG single crystals for scintillators of STEM. XIIth International Congress for Electron Microscopy, San Francisco 1990, Proceedings, p.166.

56. Schauer P., Autrata R.: Vyhodnoceni optickych vlastnosti scintilacniho detektoru v SEM. 20. ceskoslovenska konference o elektronove mikroskopii, Praha 1989, s.86.

57. Schauer P., Autrata R.: Influence of single crystal yttrium aluminates surfaces on their cathodoluminescent properties. 7th. Czechoslovak conference on electronics and vacuum physics, Bratislava 1985, Proceedings/Vol. 1, p.265.

58. Autrata R., Schauer P., Kvapil Ji., Kvapil Jos.: Single-crystal electron detectors. 8th. European Congress on Electron Microscopy, Budapest 1984, Proceedings/Vol. I, p.617.

59. Autrata R., Schauer P., Kvapil Ji., Kvapil Jos.: Monokrystalicke scintilatory pro rastrovaci elektronovy mikroskop. Dny nove techniky elektrotechnickeo vyzkumu, Praha 1983, Katalog exponatu, s.96.

60. Autrata R., Schauer P., Kvapil Jos., Kvapil Ji.: Scintillation detector for backscattered electron imaging in SEM. Surface analysis 83, Bratislava 1983, Proceedings, p.57.

61. Autrata R., Chaloupka M., Schauer P., Kvapil Jos., Kvapil Ji.: The use of single crystal scintillators for back-scattered imaging. 15 Kolloquium uber Oberflachen-abbildung und Analyse in Microbereichen, Bremen 1982, Proceedings/Vol. A, p.15.

62. Autrata R., Schauer P., Kvapil Ji., Kvapil Jo.: Influence of Ce3+ and other dopants concentration in single crystals of Y3Al5O12 and YAlO3 on their cathodoluminescent properties. European meeting on crystal growth, Prague 1982, Proceedings, p.435.

63. Autrata R., Schauer P., Kvapil Jos., Kvapil Ji.: A single crystal of Y3Al5O12:Ce3+ as a scintillator in SEM and transparent screen in electron optical devices. 10th. International Congress on Electron Microscopy, Hamburg 1982, Proceedings/Vol. I, p.451.

64. Kvapil Ji., Kvapil Jos., Autrata R., Schauer P.: Spectral properties of oxide crystals free of iron ions. Mezdunarodnaja konferencija; Defekty v dielektriceskich kristallach, Riga 1981, Vol. 1, p.48.

65. Kvapil Ji., Kvapil Jos., Manek B., Perner B., Autrata R., Schauer P.: Czochralski growth of YAG:Ce in reducing protective atmosphere. Six International Conference on Crystal Growth, Moskva 1980, Proceedings/Vol. III, p.113.

66. Autrata R., Schauer P., Kvapil Jos., Kvapil Ji.: Scintilacni detektor v rastrovacim elektronovem mikroskopu. Sbornik sympozia o stavu a perspektivach scintilacnich detektoru a jejich vyuziti, Harrachov 1980, s.80.

67. Autrata R., Schauer P.: Bystrij i dolgovecnyj monokristaliceskij scintiljator dlja rastrovovo elektronovo mikroskopa s avtoemissionnoj puskoj. XI. vsjesajuznaja konferencija po elektronnoj mikroskopii, Tallin 1979, 3, s.74.

68. Autrata R., Schauer P.: Scintillators for use in electron microscopes. XVth Czechoslovak conference on electron microscopy, Prague 1977, Proceedings/Vol. B, p.428.

Stránka aktualizována: 16. 12. 2009, 11:47
Tuto stránku zpracoval: Petr Schauer, Petr@ISIBrno.Cz